Fabrication and Characterization of thin delta E-Detectors for Spectroscopic Application
Responsible organisation
2005 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 546, no 1-2, p. 312-318Article in journal (Refereed) Published
Abstract [en]
Ultra thin delta E-detectors for spectroscopic applications have been fabricated and characterized down to a thickness of 4.5 μm. A common one-side mask aligner was in use to fabricate the detectors. The detectors display low leakage current and the resulting capacitance is close to the detector window capacitance below a threshold voltage. The detector telescope should be slightly tilted to reduce the probability for channeling. However, even better control of the thickness uniformity is needed to improve the resolution in the E-E detector telescope
Place, publisher, year, edition, pages
2005. Vol. 546, no 1-2, p. 312-318
Keywords [en]
Thin silicon detector, delta E-detector, energy straggling, ion channeling
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-2673DOI: 10.1016/j.nima.2005.03.053ISI: 000230288200058Local ID: 2077OAI: oai:DiVA.org:miun-2673DiVA, id: diva2:27705
Conference
6th International Workshop on Radiation Imaging Detectors, Jul 25-29, 2004, Glasgow, Scotland
Projects
STC - Sensible Things that Communicate
Note
6th International Workshop on Radiation Imaging Detectors, Jul 25-29, 2004, Glasgow, Scotland
2008-12-162008-12-162025-09-25Bibliographically approved