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Addressing Contextual Factors in ArUco Marker-Based Distance Estimation: A Machine Learning Approach
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).ORCID iD: 0000-0001-8661-7578
University of Salerno, Italy.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).ORCID iD: 0000-0002-3774-4850
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).ORCID iD: 0000-0001-8607-4083
2025 (English)In: 2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), IEEE conference proceedings, 2025Conference paper, Published paper (Refereed)
Abstract [en]

Accurate distance estimation is crucial for applications such as robotics and autonomous systems, where reliable measurements are needed for navigation and interaction with the environment. ArUco markers are a robust solution for distance estimation, offering precise measurements based on their geometric properties. In this paper, we, first, systematically investigate the impact of various contextual factors in an indoor environment, such as angle of observation and illumination, on the systematic error and uncertainty of distance measurements. Our experiments show that illumination (exposure) significantly influence the performance of distance estimation systems, introducing notable systematic errors in real-world settings. Second, we propose a machine learning-based approach, using a neural network, to address the challenge posed by these factors and improve the systematic error of distance estimation. Our results in dynamic outdoor environment, demonstrate the effectiveness of this approach, significantly enhancing the systematic error of distance under dynamic environmental conditions. 

Place, publisher, year, edition, pages
IEEE conference proceedings, 2025.
Keywords [en]
ArUco marker, Contextual factor, Machine learning, Neural networks, Systemic Error
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:miun:diva-55270DOI: 10.1109/I2MTC62753.2025.11079149ISI: 001554207900215Scopus ID: 2-s2.0-105012189961ISBN: 979-8-3315-0500-4 (print)OAI: oai:DiVA.org:miun-55270DiVA, id: diva2:1988576
Conference
2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Available from: 2025-08-12 Created: 2025-08-12 Last updated: 2025-12-12Bibliographically approved

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Seyed Jalaleddin, MousaviradShallari, IridaO'Nils, Mattias

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