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Characterization of micro pore optics for full-field X-ray fluorescence imaging
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-). Lund University, MAX IV Laboratory. (Radiation Sensing and Imaging Systems)ORCID iD: 0000-0002-4196-6296
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-). (Radiation Sensing and Imaging Systems)ORCID iD: 0000-0002-5619-409X
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-). (Radiation Sensing and Imaging Systems)ORCID iD: 0000-0001-5521-7491
Photonis France S.A.S., France.
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2023 (English)In: Journal of Instrumentation, E-ISSN 1748-0221, Vol. 18, no 01, article id C01017Article in journal (Refereed) Published
Abstract [en]

Elemental mapping images can be achieved through step scanning imaging using pinholeopticsor microporeoptics(MPO),oralternativelybyfull-field X-ray fluorescenceimaging (FF-XRF). X-ray optics for FF-XRF canbe manufacturedwith different micro-channelgeometries such as square, hexagonal or circular channels. Each optic geometry creates different imaging artefacts. Square-channel MPOs generate a high intensity central spot due to two reflections via orthogonal channel walls inside a single channel, which is the desirable part for image formation, and two perpendicular lines forming a cross due to reflections in one plane only. Thus, we have studied the performance of a square-channel MPO in an FF-XRF imaging system. The setup consists of a commercially available MPO provided by Photonis and a Timepix3 readout chip with a silicon detector. Imaging of fluorescence from small metal particles has been used to obtain the point spreadfunction(PSF) characteristics. The transmissionthroughMPO channelsand variation of the critical reflection angle are characterized by measurements of fluorescence from copper and titanium metal fragments. Since the critical angle of reflection is energy dependent, the cross-arm artefacts will affect the resolution differently for different fluorescence energies. It is possible to identify metal fragments due to the form of the PSF function. The PSF function can be further characterized using a Fourier transform to suppress diffuse background signals in the image.

Place, publisher, year, edition, pages
2023. Vol. 18, no 01, article id C01017
Keywords [en]
X-ray fluorescence (XRF) systems; Scintillators and scintillating fibres and light guides; Spectrometers; X-ray transport and focusing
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-44958DOI: 10.1088/1748-0221/18/01/C01017ISI: 000926596900001Scopus ID: 2-s2.0-85146494710OAI: oai:DiVA.org:miun-44958DiVA, id: diva2:1656520
Conference
23nd International Workshop on Radiation Imaging Detectors 26–30 June 2022
Projects
ImSpec - Multiple energy band imaging spectroscopy for material and object classification
Funder
Knowledge FoundationAvailable from: 2023-01-18 Created: 2022-05-06 Last updated: 2025-09-25Bibliographically approved
In thesis
1. Spectroscopic and Microscopic X-ray Fluorescence Analysis for Environmental and Industrial Applications
Open this publication in new window or tab >>Spectroscopic and Microscopic X-ray Fluorescence Analysis for Environmental and Industrial Applications
2022 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

Heavy metals are well-known environmental pollutants due to its potential impact on associated ecosystems and human health. Thus, it is important to monitor the levels of heavy metals in the environment. X-ray fluorescence (XRF) analysis is a powerful and effective screening tool in measuring the concentration of multi-elements simultaneously.

This thesis provides insight into development and implementation of XRF instruments for environmental monitoring and industrial process control. The XRF method was compared with a commercial scanning electron microscope with energy dispersive spectroscopy (SEM-EDS) for fly ash samples. Qualitative analysis and semi-quantitative analysis of Na, S, Cl, K and Cd in incineration fly ash were performed with these two similar techniques. One of the challenges of using XRF is the scattering background noise from the primary beam, which decreases the detection limit and the sensitivity of the measurement system. Hence, an X-ray beam filter was chosen to suppress the background noise for a specific element, Cr, in leachate. Numerical simulations and experiments were developed to find the proper filter material and thickness by calculating the X-ray fluorescence intensities and the signal-to-noise ratio. The developed system is capable of online monitoring of Cr levels, to certify that the concentration is below the threshold level in leachate. An XRF prototype was built and calibrated for underwater Hg analysis in maritime wet sediment using a radioisotope source. The presented results show that it is possible to detect Hg by K-shell emission thus enabling XRF analysis for sediment underwater.

For non-homogeneous samples, an image revealing the elemental distribution can be achieved by micro-XRF (µ-XRF). XRF mapping of element distributions on a microscopic level was obtained by using scanning XRF microscopy and full-field XRF projection microscopy (FF-XRF). The spatial resolution of the scanning XRF imaging setup using an X-ray tube is in the order of 100 µm, but need to be further improved to measure the homogeneity of S on individual fiber level in pulp and paper industry. For the scanning technique, it is a tradeoff between resolution and measurement time. Another technique is FF-XRF imaging, and a setup was implemented using an energy resolving pixel detector and X-ray optics. The capabilities and limitations of using X-ray optics in XRF imaging systems have been identified. These microscopy measurements can guide further comprehensive environmental and industrial monitoring missions, utilizing elemental distribution information.

Place, publisher, year, edition, pages
Mid Sweden University, 2022. p. 47
Series
Mid Sweden University doctoral thesis, ISSN 1652-893X ; 371
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-45007 (URN)978-91-89341-66-1 (ISBN)
Public defence
2022-06-17, C312, Holmgatan 10, Sundsvall, Västernorrland, 13:00 (English)
Opponent
Supervisors
Note

At the time of the defence the following papers were unpublished: paper 3 (accepted), paper 4 (in manuscript), paper 6 (in manuscript).

Available from: 2022-05-18 Created: 2022-05-18 Last updated: 2025-09-25Bibliographically approved

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Publisher's full textScopushttps://iopscience.iop.org/article/10.1088/1748-0221/18/01/C01017

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An, SiwenKrapohl, DavidThörnberg, BennyNorlin, Börje

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