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Laboratory and synchrotron validation of µ-XRF for sulfur mapping in CTMP paper samples
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).ORCID iD: 0009-0002-6915-3892
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).ORCID iD: 0000-0002-5619-409X
Mid Sweden University, Faculty of Science, Technology and Media, Department of Engineering, Mathematics, and Science Education (2023-).ORCID iD: 0000-0003-1108-9816
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2025 (English)In: Journal of Instrumentation, E-ISSN 1748-0221, Vol. 20, no 11, article id C11002Article in journal (Refereed) Published
Abstract [en]

The transition toward renewable, fiber-based packaging requires an improved understandingof chemical modifications in high-yield pulps such as chemithermomechanical pulp (CTMP). Sulfonationuniformity is essential for the energy-efficient production of high-strength CTMP pulp. However,laboratory methods only measure total sulfur and cannot illustrate its distribution at the fiber level,which can be visualized using μ-XRF. In this work, we present a laboratory μ-XRF system developedat Mid Sweden University and assess its capability to detect light elements in CTMP paper handsheets.A 32 × 32 point grid scan (1.6 × 1.6mm2 field of view, 50 μm step, 300 s/point) successfully resolvedsulfur Kα (2.31 keV) and calcium Kα (3.69 keV) fluorescence without helium flushing. Comparativemeasurements at the Elettra synchrotron confirmed consistency of sulfur peak position and spatialdistribution, with higher spectral resolution and signal-to-noise ratio. Histogram analysis usingWassersteindistance metrics demonstrated close agreement between datasets despite differing acquisitionconditions. These results demonstrate that laboratory XRF can reproducibly detect and map sulfur inCTMP fibers under ambient conditions, providing a practical tool to complement synchrotron studiesand supporting the development of energy-efficient, fiber-based packaging materials.

Place, publisher, year, edition, pages
IOP Publishing , 2025. Vol. 20, no 11, article id C11002
Keywords [en]
Data analysis, X-ray detectors, X-ray fluorescence (XRF) systems
National Category
Engineering and Technology Electrical Engineering, Electronic Engineering, Information Engineering Chemical Engineering
Identifiers
URN: urn:nbn:se:miun:diva-55934DOI: 10.1088/1748-0221/20/11/c11002ISI: 001612337100001Scopus ID: 2-s2.0-105033748042OAI: oai:DiVA.org:miun-55934DiVA, id: diva2:2012017
Note

Open access: https://iopscience.iop.org/article/10.1088/1748-0221/20/11/C11002

Available from: 2025-11-06 Created: 2025-11-06 Last updated: 2026-04-14Bibliographically approved

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Foroughi, F.Krapohl, DavidRahman, HafizurMenk, Ralf HendrikNorlin, B.

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Foroughi, F.Krapohl, DavidRahman, HafizurMenk, Ralf HendrikNorlin, B.
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Department of Computer and Electrical Engineering (2023-)Department of Engineering, Mathematics, and Science Education (2023-)
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Journal of Instrumentation
Engineering and TechnologyElectrical Engineering, Electronic Engineering, Information EngineeringChemical Engineering

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