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A study of band to band tunneling with application to high-field transport in hexagonal SiC polytypes
Solid State Electronics, Dept. of Electronics, Royal Institute of Technology, SE-16440 Kista, Sweden.
Mittuniversitetet, Fakulteten för naturvetenskap, teknik och medier, Institutionen för informationsteknologi och medier.ORCID-id: 0000-0002-3790-0729
Mittuniversitetet, Fakulteten för naturvetenskap, teknik och medier, Institutionen för informationsteknologi och medier.
2001 (engelsk)Inngår i: 3rd European Conference on Silicon Carbide and Related Materials KLOSTER BANZ, GERMANY, SEP, 2000, 2001, s. 487-490Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

The band structure of hexagonal SiC polytypes has regions in the k-space where two or more energy bands are very close to each other. Tunneling of electrons (or holes) between bands due to a high electric field is one of the processes that may allow the electron to jump between energy bands. It is important to consider this effect in order to understand high-field transport properties in these polytypes. In this work we have used the two-band k·p approximation [1] to calculate the time-dependent tunneling probability for electron transitions between two bands using the approach of Krieger and Iafrate (KI) [2]. Electric field strengths between 0.1-4 MV/cm have been used to study the effect of tunneling. Drift times in the order of 10 fs have been considered, which is representative for the time between scattering events. We have applied the k·p approximation to different points in the Brillouin zone of 4H-SiC and proved that there is considerable tunneling between bands under realistic electric field strengths and scattering times.

sted, utgiver, år, opplag, sider
2001. s. 487-490
Serie
Materials science forum, ISSN 0255-5476 ; 353-3
Emneord [en]
Band to band tunneling; High electric fields; High field transport; Polytypes; Time dependent tunneling probability
HSV kategori
Identifikatorer
URN: urn:nbn:se:miun:diva-5840ISI: 000168535200119Scopus ID: 4243853664Lokal ID: 3623ISBN: 0-87849-873-7 (tryckt)OAI: oai:DiVA.org:miun-5840DiVA, id: diva2:30873
Konferanse
3rd European Conference on Silicon Carbide and Related Materials;Kloster Banz, Ger;Code45058
Tilgjengelig fra: 2008-09-30 Laget: 2008-09-30 Sist oppdatert: 2025-09-25bibliografisk kontrollert

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Nilsson, Hans-ErikLindefelt, Ulf

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