Experimental characterization of the PERCIVAL soft X-ray detectorDeutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Science & Technology Faculties (STFC), Didcot, U.K.
Science & Technology Faculties (STFC), Didcot, U.K.
Science & Technology Faculties (STFC), Didcot, U.K.
Science & Technology Faculties (STFC), Didcot, U.K.
Science & Technology Faculties (STFC), Didcot, U.K.
ELETTRA Sincrotrone Trieste, Trieste, Italy.
ELETTRA Sincrotrone Trieste, Trieste, Italy.
ELETTRA Sincrotrone Trieste, Trieste, Italy.
ELETTRA Sincrotrone Trieste, Trieste, Italy.
ELETTRA Sincrotrone Trieste, Trieste, Italy.
Diamond Light Source (DLS), Didcot, U.K.
Diamond Light Source (DLS), Didcot, U.K.
Diamond Light Source (DLS), Didcot, U.K.
Diamond Light Source (DLS), Didcot, U.K.
Diamond Light Source (DLS), Didcot, U.K.
Diamond Light Source (DLS), Didcot, U.K.
Pohang Accelerator Lab (PAL), Pohang, South Korea.
Pohang Accelerator Lab (PAL), Pohang, South Korea.
Pohang Accelerator Lab (PAL), Pohang, South Korea.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design. Deutsches Elektronen-Synchrotron (DESY). (Radiation Sensor Systems)
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design.
Show others and affiliations
2016 (English)In: 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015, Institute of Electrical and Electronics Engineers (IEEE), 2016, article id 7581940Conference paper, Published paper (Other academic)
Abstract [en]
Considerable interest has been manifested for the use of high-brilliance X-ray synchrotron sources and X-ray Free-Electron Lasers for the investigation of samples.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2016. article id 7581940
National Category
Engineering and Technology Subatomic Physics
Identifiers
URN: urn:nbn:se:miun:diva-26298DOI: 10.1109/NSSMIC.2015.7581940Scopus ID: 2-s2.0-84994107250Local ID: STCISBN: 9781467398626 (print)OAI: oai:DiVA.org:miun-26298DiVA, id: diva2:873496
Conference
2015 IEEE Nuclear Science Symposium and Medical Imaging Conference / Symposium on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors, October 31 - November 7, San Diego, California, USA
2015-11-242015-11-242025-02-14Bibliographically approved
In thesis