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Estimate of measurement uncertainty using analog switches in electronic test
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
2004 (English)In: Proccedings of the 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004, 2004, 184-188 p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
2004. 184-188 p.
Identifiers
URN: urn:nbn:se:miun:diva-24548Scopus ID: 2-s2.0-84910012235ISBN: 978-163439188-7 (print)OAI: oai:DiVA.org:miun-24548DiVA: diva2:794658
Conference
10th IMEKO TC7 Symposium on Advances of Measurement Science 2004; St. Petersburg; Russian Federation; 30 June 2004 through 2 July 2004
Available from: 2015-03-12 Created: 2015-03-12 Last updated: 2015-04-10Bibliographically approved

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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf