Open this publication in new window or tab >>2014 (English)In: Proceedings of SPIE - The International Society for Optical Engineering, San Francisco, California, United States: SPIE - International Society for Optical Engineering, 2014, p. Art. no. 90180F-Conference paper, Published paper (Refereed)
Abstract [en]
We propose expanding the Murray-Davies formula by adding the effect of edges of solid inks in a halftoned image. The expanded formula takes into account the spectral reflectance of paper white, full tone ink and mixed area scaled by the fractional area coverages. Here, mixed area mainly refers to the edge of an inked dot where the density is very low, and lateral exchange of photons can occur. Also, in such area the paper micro components may have higher scattering power than ink, especially, in uncoated paper. Our methodology uses cyan, magenta and yellow separation ramps printed on different papers by impact and non-impact based printing technologies. The samples include both frequency and amplitude modulation halftoning methods of various print resolutions. Based on pixel values, the captured microscale halftoned image is divided into three categories: solid ink, mixed area, and unprinted paper between the dots. The segmented images are then used to measure the fractional area coverage that the model receives as parameters. We have derived the characteristic reflectance spectrum of mixed area by rearranging the expanded formula and replacing the predicted term with the measured value using half of the maximum colorant coverage. Performance has clearly improved over the Murray-Davies model with and without dot gain compensation, more importantly, preserving the linear additivity of reflectance of the classical physics-based model.
Place, publisher, year, edition, pages
San Francisco, California, United States: SPIE - International Society for Optical Engineering, 2014
Keywords
Printing, color, model, Murray Davies, reflectance, halftoning, segmentation, dot gain, k-means.
National Category
Engineering and Technology
Identifiers
urn:nbn:se:miun:diva-20315 (URN)10.1117/12.2037754 (DOI)000335757500014 ()2-s2.0-84897467351 (Scopus ID)978-081949935-6 (ISBN)
Conference
Measuring, Modeling, and Reproducing Material Appearance; San Francisco, CA; United States; 3 February 2014 through 4 February 2014; Code 103465
Projects
EU Marie Curie Initial Training Networks (ITN) CP7.0
Funder
EU, European Research Council, N-290154
Note
Manuscripts from this conference will appear as Proceedings of SPIE Volume 9018 on SPIE Digital Library within 2-4 weeks after conference.
2013-11-262013-11-262015-01-02Bibliographically approved