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Investigation on the directional dark-field signals from paperboards using a grating interferometer
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design. (Radiation Sensor Systems)
University of Erlangen-Nuremberg, ECAP-Erlangen Centre for Astroparticle Physics, Erwin-Rommel-Str. 1, 91058 Erlangen, Germany .
University of Erlangen-Nuremberg, ECAP-Erlangen Centre for Astroparticle Physics, Erwin-Rommel-Str. 1, 91058 Erlangen, Germany .
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design.ORCID iD: 0000-0002-8325-5177
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2014 (English)In: Journal of Instrumentation, ISSN 1748-0221, E-ISSN 1748-0221, Vol. 9, Art. no. C04032- p.Article in journal (Refereed) Published
Abstract [en]

Recent advancements in the grating interferometer based Phase Contrast X-ray Imag- ing (PCXI) technique enables high quality dark-field images to be obtained using conventional X-ray tubes. The dark-field images map the scattering inhomogeneities inside objects. Since, the dark-field image is constructed by considering only those photons which are scattered while pass- ing through the objects, it can reveal useful information about the object inner structures, such as, the fibre structures inside paperboards.

The end-use performance of paperboards, such as the printing quality and the stiffness de-pends on the uniformity in the thickness and the structures of the coating layer of the paperboards. The uniformity in the coating layer is determined by the coating techniques, the coating materials and the topography of the base sheet. In this article, the dark-field signals from four paperboard samples with different quality indices are analysed. The isotropic and the anisotropic scattering coefficients for all of the samples have been calculated. Based on the correlation between the isotropic coefficients and the quality indices of the paperboards, a new method for paperboard quality measurement has been suggested.

Place, publisher, year, edition, pages
2014. Vol. 9, Art. no. C04032- p.
Keyword [en]
Data processing methods, Inspection with x-rays, Interferometry, X-ray detectors
National Category
Electrical Engineering, Electronic Engineering, Information Engineering Paper, Pulp and Fiber Technology
Identifiers
URN: urn:nbn:se:miun:diva-21822DOI: 10.1088/1748-0221/9/04/C04032ISI: 000336123800032Scopus ID: 2-s2.0-84899557220Local ID: STCOAI: oai:DiVA.org:miun-21822DiVA: diva2:713874
Available from: 2014-04-24 Created: 2014-04-24 Last updated: 2017-03-06Bibliographically approved
In thesis
1. Phase-Contrast and Spectroscopic X-ray Imaging for Paperboard Quality Assurance
Open this publication in new window or tab >>Phase-Contrast and Spectroscopic X-ray Imaging for Paperboard Quality Assurance
2014 (English)Licentiate thesis, comprehensive summary (Other academic)
Abstract [en]

The end-use performance of a paperboard depends on its quality.

The major properties of a good quality paperboard include consistency

in the expected ratio between the thickness of the core and

the coating layers, and the uniformity in the coating layer. Measurement

systems using X-rays to monitor these properties could assist

the paperboard industries to assure the quality of their products in a

non-destructive and automatic manner.

 

Phase Contrast X-ray Imaging (PCXI) has been used successfully

to look inside a wide range of objects using synchrotron radiation

sources. Recent advancements in the grating interferometer based

PCXI technique enables high quality phase-contrast and dark-field

images to be obtained using conventional X-ray tubes. The darkfield

images map the scattering inhomogeneities inside objects and

is very sensitive to micro-structures, and thus, can reveal useful information

about the object’s inner structures, such as, the fibre structures

inside paperboards.

 

In this thesis, methods, using spectroscopic X-ray imaging and

PCXI technique have been demonstrated to measure paperboard quality.

The thicknesses of the core and the coating layers on a paperboard

with the coating layer on only one side can be measured using

spectroscopic X-ray imaging technique. However, the limited

spectral and spatial resolution offered by the measurement system

being used led to the measured thicknesses of the layers being lower

than their actual thicknesses in the paperboard sample. Suggestions

have been made in relation to overcoming these limitations and to

enhance the performance of the method.

 

The dark-field signals from paperboard samples with different quality

indices are analysed. The isotropic and the anisotropic scattering

coefficients for all of the samples have been calculated. Based

on the correlation between the isotropic coefficients and the quality

indices of the paperboards, suggestions have been made for paperboard

quality measurements.

Place, publisher, year, edition, pages
Sundsvall: Mid Sweden University, 2014. 96 p.
Series
Mid Sweden University licentiate thesis, ISSN 1652-8948 ; 110
National Category
Electrical Engineering, Electronic Engineering, Information Engineering Materials Engineering
Identifiers
urn:nbn:se:miun:diva-21910 (URN)STC (Local ID)978-91-87557-46-0 (ISBN)STC (Archive number)STC (OAI)
Presentation
2014-05-22, M102, Sundsvall, 10:15 (English)
Opponent
Supervisors
Funder
Knowledge Foundation
Available from: 2014-05-12 Created: 2014-05-06 Last updated: 2017-03-06Bibliographically approved
2. Advanced X-ray Detectors for Industrial and Environmental Applications
Open this publication in new window or tab >>Advanced X-ray Detectors for Industrial and Environmental Applications
2016 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

The new generation of X-ray free electron laser sources arecapable of producing light beams with billion times higherpeak brilliance than that of the best conventional X-ray sources.This advancement motivates the scientific community to pushforward the detector technology to its limit, in order to de-sign photon detectors which can cope with the extreme fluxgenerated by the free electron laser sources. Sophisticated ex-periments like deciphering the atomic details of viruses, filmingchemical reactions or investigating the extreme states of matterrequire detectors with high frame rate, good spatial resolution,high dynamic range and large active sensor area. The PERCI-VAL monolithic active pixel sensor is being developed by aninternational group of scientists in collaboration to meet theaforementioned detector requirements within the energy rangeof 250 eV to 1 keV, with a quantum efficiency above 90%.In this doctoral researchwork, Monte Carlo algorithm basedGeant4 and finite element method based Synopsys SentaurusTCADtoolkits have been used to simulate, respectively, theX-rayenergy deposition and the charge sharing in PERCIVAL. Energydeposition per pixel and charge sharing between adjacent pixelsat different energies have been investigated and presented.Novel methods for industrial and environmental applica-tions of some commercially available X-ray detectors have beendemonstrated. Quality inspection of paperboards by resolv-ing the layer thicknesses and by investigating orientation ofthe cellulose fibres have been performed using spectroscopicand phase-contrast X-ray imaging. It was found that, usingphase-contrast imaging it is possible to set burn-out like qualityindex on paperboards non-destructively. X-ray fluoroscopicmeasurements have been conducted in order to detect Cr inwater. This method can be used to detect Cr and other toxicelements in leachate in landfills and other waste dumping sites.

Abstract [sv]

Acceleratorbaserade röntgenkällor utvecklas ständigt, dessakan producera röntgenstrålning med miljarder gånger så högeffekttäthet som de starkaste konventionella röntgenkällorna.Därför finns en vetenskaplig utmaning att utveckla röntgende-tektorer som inte förstörs i de extrema flöden som genereras avdessa röntgenkällor. De visioner som finns för de nya källornaär t.ex.; att avbilda detaljer av virus ner på atomnivå, att filmakemiska reaktioner eller att undersöka extrema tillstånd hos ma-teria. Dessa typer av experiment kräver röntgendetektorer medhög bildhastighet, hög spatial upplösning och stort intensitets-omfång och stor aktiv sensoryta. Detektorsystemet PERCIVALsom bygger på aktiva pixlar med energiupplösning utvecklasinom ett internationellt vetenskapligt samarbetsprojekt. Må-let är att uppfylla detektorspecifikationerna för de nämndaexperimenten inom energiområdet 250 eV till 1 keV, med enkvantverkningsgrad över 90 %.I föreliggande vetenskapliga avhandlingsarbete har simule-ringar av energideponering i PERCIVAL-detektorn genomförtsbaserat på Monte Carlo-algoritmer och simuleringar av ladd-ningsdelning mellan pixlar har simulerats med hjälp av finitaelementmetoden. Därmed har energideponeringen per pixeloch laddningsdelningen mellan närliggande pixlar vid olikaenergier kunnat utredas och presenteras.I avhandlingen demonstreras nya lovande metoder för in-dustriella applikationer och miljöövervakning,därkommersiellttillgängliga röntgendetektorer kan användas. Kvalitetsövervak-ning av kartongtillverkning genom att mäta bestrykningstjock-lek och fiberorientering kan realiseras med energiupplöstaröntgenbilder eller faskontrastbilder i röntgenområdet. Det kankonstateras att med icke-förstörande provning, genom faskon-trastbilder, kan kvalitetsindexvärlden erhållas på samma sättsom kvalitetsindex kan erhållas från ”burn-out”-mätningar.Spektroskopiska mätningar av röntgenflourescens har genom-förts för att detektera krom (Cr) i vatten. Metodik för att detek-tera krom och andra giftiga metaller i lakvatten från deponioch annan lagring för giftigt avfall har utarbetats.

Place, publisher, year, edition, pages
Sundsvall: Mid Sweden University, 2016. 159 p.
Series
Mid Sweden University doctoral thesis, ISSN 1652-893X ; 253
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-29264 (URN)STC (Local ID)978-91-88025-84-5 (ISBN)STC (Archive number)STC (OAI)
Public defence
2016-12-01, M108, Sundsvall, 10:15 (English)
Opponent
Supervisors
Available from: 2016-11-10 Created: 2016-11-10 Last updated: 2017-06-30Bibliographically approved

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Reza, SalimFröjdh, ChristerThim, JanNorlin, Börje

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