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Sample Preparation Using Argon Ion Beam Milling
Mid Sweden University, Faculty of Science, Technology and Media, Department of Chemical Engineering.
2013 (English)In: Argon: Production, Characteristics and Applications / [ed] Bogos Nubar Sismanoglu, Homero Santiago Maciel, Marija Radmilovic-Radjenovic, Rodrigo Savio Pessoa (Physics Department, Lab of Optics and Spectroscopy, Lab of Plasmas and Processes and Lab of Mechanics, Heath and Waves, Technological Institute of Aeronaut, Hauppauge, NY: Nova Science Publishers, Inc., 2013, p. 223-240Chapter in book (Other academic)
Abstract [en]

Surface and cross section analysis can provide important information on material properties. It has, however, been difficult to characterise the internal structure at a micro scale using cross sections prepared with conventional methods, such as e.g. mechanical grinding and polishing, because these procedures can damage the surface and introduce artefacts. A few years ago, a new precision argon ion beam cross section polisher was shown to be a suitable sample preparation technique for microstructure characterisation. It produces high quality cross sections free from artefacts and distortions. This technique can be used for cross section preparation of a wide variety of materials including composites, metals, ceramics and polymers. Argon ion beam milling can also be used in combination with focused ion beam (FIB) as a final step to remove FIB-damaged layers before nano- and microstructure characterisation in high resolution transmission electron microscopy (HRTEM).

Place, publisher, year, edition, pages
Hauppauge, NY: Nova Science Publishers, Inc., 2013. p. 223-240
National Category
Chemical Sciences
Identifiers
URN: urn:nbn:se:miun:diva-20486Scopus ID: 2-s2.0-84891971247ISBN: 978-1-62618-204-2 (print)OAI: oai:DiVA.org:miun-20486DiVA, id: diva2:676476
Available from: 2013-12-06 Created: 2013-12-06 Last updated: 2014-02-03Bibliographically approved

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Dahlström, Christina

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