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Performance tests of an AGIPD 0.4 assembly at the beamline P10 of PETRA III
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany .
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany .
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany .
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany .
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2013 (English)In: Journal of Instrumentation, ISSN 1748-0221, E-ISSN 1748-0221, Vol. 8, no 6, p. Art. no. P06007-Article in journal (Refereed) Published
Abstract [en]

The Adaptive Gain Integrating Pixel Detector (AGIPD) is a novel detector system, currently under development by a collaboration of DESY, the Paul Scherrer Institute in Switzerland, the University of Hamburg and the University of Bonn, and is primarily designed for use at the European XFEL. To verify key features of this detector, an AGIPD 0.4 test chip assembly was tested at the P10 beamline of the PETRA III synchrotron at DESY. The test chip successfully imaged both the direct synchrotron beam and single 7.05 keV photons at the same time, demonstrating the large dynamic range required for XFEL experiments. X-ray scattering measurements from a test sample agree with standard measurements and show the chip's capability of observing dynamics at the microsecond time scale.

Place, publisher, year, edition, pages
2013. Vol. 8, no 6, p. Art. no. P06007-
Keywords [en]
Instrumentation for FEL, X-ray detectors
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-19917DOI: 10.1088/1748-0221/8/06/P06007ISI: 000321627400018Scopus ID: 2-s2.0-84879324148Local ID: STCOAI: oai:DiVA.org:miun-19917DiVA, id: diva2:655823
Available from: 2013-10-14 Created: 2013-09-25 Last updated: 2017-12-06Bibliographically approved

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Graafsma, Heinz

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