miun.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Mapping the x-ray response of a CdTe sensor with small pixels using an x-ray microbeam and a single photon processing readout chip
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (Radiation detection)
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (Radiation detection)ORCID iD: 0000-0002-8325-5177
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (Radiation detection)
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (Radiation detection)
2011 (English)In: Proceedings of SPIE - The International Society for Optical Engineering / [ed] Larry A. Franks, Ralph B. James, Arnold Burger, SPIE - International Society for Optical Engineering, 2011, Art. no. 814208- p.Conference paper, Published paper (Refereed)
Abstract [en]

CdTe is a promising material for X-ray imaging since it has high stopping power for X-rays. However defects in the material, non ideal charge transport and long range X-ray fluorescence deteriorates the image quality. We have investigated the response of a CdTe sensor with very small pixels using an X-ray microbeam entering the sensor at a small incident angle. Effects of defects as well as depth of interaction can be measured by this method. Both electron and hole collection mode has been tested. The results show distorted electrical field around defects in the material and also shows the small pixel effect. It is also shown that charge summing can be used to get correct spectral information.

Place, publisher, year, edition, pages
SPIE - International Society for Optical Engineering, 2011. Art. no. 814208- p.
Keyword [en]
CdTe; characterization; single photon processing; energy resolution
National Category
Accelerator Physics and Instrumentation Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-15078DOI: 10.1117/12.896796ISI: 000297626500006Scopus ID: 2-s2.0-80055038577Local ID: STCISBN: 978-081948752-0 (print)OAI: oai:DiVA.org:miun-15078DiVA: diva2:462454
Conference
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII; San Diego, CA; 22 August 2011 through 24 August 2011;
Available from: 2011-12-07 Created: 2011-12-07 Last updated: 2016-10-19Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Fröjdh, ErikFröjdh, ChristerNorlin, BörjeThungström, Göran
By organisation
Department of Information Technology and Media
Accelerator Physics and InstrumentationElectrical Engineering, Electronic Engineering, Information Engineering

Search outside of DiVA

GoogleGoogle Scholar

Altmetric score

Total: 449 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf