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Instrumentation of STM and AFM combined with transmission electron microscope
2001 (English)In: Applied Physics A: Materials Science & Processing, ISSN 0947-8396, E-ISSN 1432-0630, Vol. 72, no 7, p. 71-74Article in journal (Refereed) Published
Abstract [en]

A scanning tunneling microscope (STM) combined with a transmission electron microscope (TEM) is a powerful tool for direct investigation of structures, electronic properties, and interactions at the atomic scale. Here, we report on two different designs of such TEM-STM as well as an extension with an atomic force microscope (TEM-AFM). In the first TEM-STM design, a stepper motor, combined with a one-dimensional inertial slider, was used to perform the coarse approach. The advantage of this design was the strong pulling force that enabled notched metallic wires to be broken inside the TEM, which lead to clean sample surfaces. A second design, with a three-dimensional inertial slider, allowed lateral motion inside the TEM, which simplified the adjustment of tip location on the sample. By replacing the STM tip with a standard AFM-cantilever chip, a new combination was demonstrated: TEM-AFM. Here the force was simply measured by direct TEM imaging of the motion of the AFM tip. Some experimental results are included to illustrate the capabilities of TEM-STM and TEM-AFM.

Place, publisher, year, edition, pages
2001. Vol. 72, no 7, p. 71-74
Keywords [en]
nanoteknik nanoscience TEM-SPM
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:miun:diva-6185DOI: 10.1007/s003390100636Local ID: 1844OAI: oai:DiVA.org:miun-6185DiVA, id: diva2:31224
Available from: 2009-02-18 Created: 2009-02-18 Last updated: 2017-12-12Bibliographically approved

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Olin, Håkan

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