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Electronic properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
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2004 (English)In: Silicon Carbide: recent major advances, Berlin: Springer, 2004, p. 89-118Chapter in book (Other academic)
Place, publisher, year, edition, pages
Berlin: Springer, 2004. p. 89-118
Series
Advanced texts in physics, ISSN 1439-2674
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Natural Sciences
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URN: urn:nbn:se:miun:diva-5828Local ID: 3592ISBN: 3540404589 (print)OAI: oai:DiVA.org:miun-5828DiVA, id: diva2:30861
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2012-01-17Bibliographically approved

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Lindefelt, Ulf

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CiteExportLink to record
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Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
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  • de-DE
  • en-GB
  • en-US
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