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Electronic properties of Stacking Faults and Thin Cubic Inclusions in SiC Polytypes
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
Responsible organisation
2004 (English)In: Silicon Carbide: recent major advances, Berlin: Springer, 2004, 89-118 p.Chapter in book (Other academic)
Place, publisher, year, edition, pages
Berlin: Springer, 2004. 89-118 p.
Series
Advanced texts in physics, ISSN 1439-2674
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:miun:diva-5828Local ID: 3592ISBN: 3540404589 (print)OAI: oai:DiVA.org:miun-5828DiVA: diva2:30861
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2012-01-17Bibliographically approved

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Lindefelt, Ulf
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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf