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In-situ Characterization of Charge and Mass Transport using a combined STM and TEM
Mid Sweden University, Faculty of Science, Technology and Media, Department of Engineering, Physics and Mathematics.ORCID iD: 0000-0001-7329-3359
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2006 (English)In: 16th International microscopy congress, Sapporo, Japan 2006, 2006Conference paper, (Other scientific)
Place, publisher, year, edition, pages
2006.
Keyword [en]
nanotechnology nanoteknik temspm
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Natural Sciences
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URN: urn:nbn:se:miun:diva-3921Local ID: 4295OAI: oai:DiVA.org:miun-3921DiVA: diva2:28953
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2013-08-23Bibliographically approved

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Olin, Håkan
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CiteExportLink to record
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Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
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Output format
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