miun.sePublications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Evaluation of a pre-cell hit detector for the future single ion hit facility in Lund
University of Leipzig, Germany; Lund Institute of Technology.
Lund Institute of Technology.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
Lund Institute of Technology.
Show others and affiliations
2006 (English)In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, ISSN 0168-583X, E-ISSN 1872-9584, Vol. 249, no 1-2, 924-927 p.Article in journal (Refereed) Published
Abstract [en]

Currently, a single ion hit facility, for irradiation of single cells with single, light MeV ions is under development at the Lund Nuclear Microprobe. In this paper, a novel approach to the ion detection issue is presented. A silicon detector, a type utilized at other facilities for post-cell ion detection, has been investigated as a possible option for pre-cell hit detection. If proven successful, this detector could possibly also be used simultaneously as vacuum window.

The first experiments carried out on the 9 mu m thick silicon detector, with an area of 4 mm(2), have been aimed at investigations of signal-to-noise ratio and efficiency. The results thus far reveal a low noise level and a noise distribution, which is well separated from the signal peak. However, the efficiency remains a problem, since at present it is far from the required 100%.

Place, publisher, year, edition, pages
2006. Vol. 249, no 1-2, 924-927 p.
Keyword [en]
SIHF Single cels single ions thin silicon detctors
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-3816DOI: 10.1016/j.nimb.2006.03.165ISI: 000239545000224Scopus ID: 2-s2.0-33745856978Local ID: 4088OAI: oai:DiVA.org:miun-3816DiVA: diva2:28848
Conference
17th International Conference on Ion Beam Analysis, Jun 26-Jul 01, 2005, Seville, Spain
Projects
STC - Sensible Things that Communicate
Note

17th International Conference on Ion Beam Analysis, JUN 26-JUL 01, 2005, Seville, Spain

Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2016-09-29Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Thungström, Göran
By organisation
Department of Information Technology and Media
In the same journal
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Electrical Engineering, Electronic Engineering, Information Engineering

Search outside of DiVA

GoogleGoogle Scholar

Altmetric score

Total: 394 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf