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Submicron YBa2Cu3Ox ramp Josephsson junctions
Mid Sweden University, Faculty of Science, Technology and Media, Department of Engineering, Physics and Mathematics.
2002 (English)In: Applied Physics Letters, ISSN 0003-6951, Vol. 80, no 6, 1022-1024 p.Article in journal (Refereed) Published
Abstract [en]

Submicron YBa2Cu3Ox /PrBa2Cu2.6Ga0.4Ox /YBa2Cu3Ox ramp-type Josephson junctions were fabricated and tested. The submicron bridges in the top electrode were patterned by e-beam lithography and Ar ion milling through an amorphous carbon (a-C) mask. Junctions with width ranging from 0.2 to 8 mm and oriented along different crystal directions of YBa2Cu3Ox have been produced. Current–voltage characteristics show a behavior consistent with the resistively shunted junction model with small excess current. Junction critical current densities of about 10 kA/cm2 and characteristic voltages up to 6 mV were measured at 4.2 K for the submicron junctions. Junctions along different crystal orientations showed different characteristics suggesting an influence from the d-wave order parameter.

Place, publisher, year, edition, pages
2002. Vol. 80, no 6, 1022-1024 p.
Keyword [en]
Supraledare, Nanoteknik, elektronstrålelitografi
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:miun:diva-3793DOI: 10.1063/1.1448176Local ID: 4508OAI: oai:DiVA.org:miun-3793DiVA: diva2:28825
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2011-01-10Bibliographically approved

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Högberg, Björn
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CiteExportLink to record
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