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Evaluation of the charge sharing effects on spot intensity in XRD setup using photon counting pixel detectors
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.ORCID iD: 0000-0002-3790-0729
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (STC)
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (STC)
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (STC)ORCID iD: 0000-0002-8325-5177
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2005 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 563, no 1, 182-186 p.Article in journal (Refereed) Published
Abstract [en]

In this study we examine how charge loss due to charge sharing in photon counting pixel detectors affects the recording of spot intensity in an X-ray Diffraction (XRD) setup. In the photon counting configuration the charge from photons that are absorbed at the boarder of a pixel will be shared between two pixels. If the threshold is high enough these photons will not be counted. However, if the threshold is low enough these photons will be counted twice. In an XRD setup the intensity and position of various spots should be recorded. Thus, the intensity measure will be affected by the setting of the threshold. In this study we used a system level Monte Carlo simulator to evaluate the variations in the intensity signals for different threshold settings and spot sizes. The simulated setup included an 8keV monochromatic source (providing a Gaussian shaped spot) and the MEDIPIX2 photon counting pixel detector (55 µm x 55 µm pixel size with 300µm silicon) at various detector biases. Our study shows that the charge sharing distortion can be compensated by numerical post processing and high resolution in both charge (charge distribution?) and position can be achieved.

Place, publisher, year, edition, pages
2005. Vol. 563, no 1, 182-186 p.
Keyword [en]
Photon counting, X-ray imaging, XRD, Medipix, Pixel Detectors
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-3328DOI: 10.1016/j.nima.2006.01.091ISI: 000238764700043Scopus ID: 2-s2.0-33744975884Local ID: 3281OAI: oai:DiVA.org:miun-3328DiVA: diva2:28360
Conference
7th International Workshop on Radiation Imaging Detectors, Jul 04-07, 2005, Grenoble, France
Note

7th International Workshop on Radiation Imaging Detectors, Jul 04-07, 2005, Grenoble, France

Available from: 2008-09-30 Created: 2009-01-16 Last updated: 2016-10-05Bibliographically approved

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Nilsson, Hans-ErikMattsson, ClaesNorlin, BörjeFröjdh, Christer
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Department of Information Technology and Media
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Electrical Engineering, Electronic Engineering, Information Engineering

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