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Method for increasing the measurement information from a transmission electron microscope and a transmission electron microscope device
Mid Sweden University, Faculty of Science, Technology and Media, Department of Natural Sciences.ORCID iD: 0000-0001-7329-3359
Responsible organisation
2005 (English)Patent (Other (popular science, discussion, etc.))
Abstract [en]

This invention relates to a method for increasing the measurement information available from a transmission electron microscope, said information relating to a measurement sample, comprising the step of: including, in said transmission electron microscope, an atomic force microscopy device. This invention also relates to a transmission electron microscopy device, characterised in that a transmission electron microscope is combined with an atomic force microscope, positioned within said transmission electron microscope. Finally, the invention relates to a device for insertion in a transmission electron microscope, characterised in that said device comprises an atomic force microscopy device.

Place, publisher, year, edition, pages
2005.
Keyword [en]
TEM-SPM nanotechnology
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:miun:diva-3166Local ID: 3108OAI: oai:DiVA.org:miun-3166DiVA: diva2:28198
Patent
US6864483 (2005-03-08)
Available from: 2008-12-02 Created: 2008-11-28 Last updated: 2013-08-23Bibliographically approved

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