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Large-area Topography Analysis and Near-field Raman Spectroscopy using Bent Fibre Probes
Chalmers University of Technology.ORCID iD: 0000-0001-7329-3359
2003 (English)In: Journal of Microscopy, ISSN 0022-2720, E-ISSN 1365-2818, Vol. 210, no 3, p. 269-273Article in journal (Refereed) Published
Abstract [en]

We present a method for combined far-field Raman imaging, topography analysis and near-field spectroscopy. Surface-enhanced Raman spectra of Rhodamine 6G (R6G) deposited on silver nanoparticles were recorded using a bent fibre aperture-type near-field scanning optical microscope (NSOM) operated in illumination mode. Special measures were taken to enable optical normal-force detection for control of the tip–sample distance. Comparisons between far-field Raman images of R6G-covered Ag particle aggregates with topographic images recorded using atomic force microscopy (AFM) indicate saturation effects due to resonance excitation.

Place, publisher, year, edition, pages
2003. Vol. 210, no 3, p. 269-273
Keyword [en]
nanotechnology nanoscience nanowires NSOM
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:miun:diva-2239DOI: 10.1046/j.1365-2818.2003.01142.xLocal ID: 1391OAI: oai:DiVA.org:miun-2239DiVA: diva2:27271
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2017-12-12Bibliographically approved

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Olin, Håkan

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