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High-resolution electron time-of-flight apparatus for the soft X-ray region
Mid Sweden University.
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1998 (English)In: Review of Scientific Instruments, ISSN 0034-6748, Vol. 69, no 11, 3809-3817 p.Article in journal (Refereed) Published
Abstract [en]

A gas-phase time-of-flight (TOF) apparatus, capable of supporting as many as six electron-TOF analyzers viewing the same interaction region, has been developed to measure energy- and angle-resolved electrons with kinetic energies up to 5 keV. Each analyzer includes a newly designed lens system that can retard electrons to about 2% of their initial kinetic energy without significant loss of transmission; the analyzers can thus achieve a resolving power (E/Delta_E) greater than 10(4) over a wide kinetic-energy range. Such high resolving power is comparable to the photon energy resolution of state-of-the-art synchrotron-radiation beamlines in the soft x-ray range, opening the TOF technique to numerous high-resolution applications. In addition, the angular placement of the analyzers, by design, permits detailed studies of nondipolar angular distribution effects in gas-phase photoemission.

Place, publisher, year, edition, pages
1998. Vol. 69, no 11, 3809-3817 p.
Keyword [en]
ADVANCED LIGHT-SOURCE, PHOTOIONIZATION, SPECTROSCOPY, EXCITATION, APPROXIMATION, IONIZATION, BEAMLINE, ENERGIES, HELIUM
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:miun:diva-2084Local ID: 1092OAI: oai:DiVA.org:miun-2084DiVA: diva2:27116
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2011-01-10Bibliographically approved

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