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Monte Carlo simulations of the imaging properties of scintillator coated X-ray pixel detectors
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.ORCID iD: 0000-0002-8325-5177
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.ORCID iD: 0000-0002-3790-0729
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2000 (English)In: IEEE Nuclear Science Symposium and Medical Imaging Conference: vol. 1, IEEE conference proceedings, 2000, Vol. 1, 6/282-6/285 p.Conference paper, (Refereed)
Abstract [en]

The imaging properties of X-ray pixel detectors depend on the quantum efficiency for X-rays, the generated signal for each X-ray photon and the distribution of the generated signal between different pixels. In a scintillator coated device the signal is generated both by X-ray photons captured in the scintillator and by X-ray photons captured directly in the semiconductor. Hence, the signal-to-noise ratio (SNR) in the image is then a function of the number of photons captured in each of these processes, and the yield of each process, in terms of electron-hole pairs (EHPs) produced in the semiconductor. The full process from the absorption of the X-ray photon to the final signal read out from the detector has been simulated with a combination of the Monte Carlo program MCNP and the commercial carrier transport simulation tool MEDICI. An in house program calculating the light transport between the scintillator and the semiconductor serves as a link

Place, publisher, year, edition, pages
IEEE conference proceedings, 2000. Vol. 1, 6/282-6/285 p.
Keyword [en]
X-ray detector, pixel, imaging
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-1864DOI: 10.1109/NSSMIC.2000.949209Scopus ID: 2-s2.0-0034593998Local ID: 656ISBN: 0-7803-6503-8 (print)OAI: oai:DiVA.org:miun-1864DiVA: diva2:26896
Conference
2000 IEEE Nuclear Science Symposium Conference Record; Lyon; France; 15 October 2000 through 20 October 2000
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2016-10-11Bibliographically approved

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Dubaric, ErvinFröjdh, ChristerHjelm, MatsNilsson, Hans-ErikAbdallah, Munir
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CiteExportLink to record
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Citation style
  • apa
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  • modern-language-association-8th-edition
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