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Extremely Thin Silicon DE Detectors For Ion Beam Analysis
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
1998 (English)In: Nuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms, ISSN 0168-583X, Vol. B 136-138, 616- p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
1998. Vol. B 136-138, 616- p.
Keyword [en]
DE detector ion beam analysis
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-1561Local ID: 771OAI: oai:DiVA.org:miun-1561DiVA: diva2:26593
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2011-01-10Bibliographically approved

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Thungström, Göran
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CiteExportLink to record
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Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
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