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Energy Resolved X-ray Imaging as a Tool for Characterization of Paper Coating Quality
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (STC)
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media. (STC)ORCID iD: 0000-0002-8325-5177
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Information Technology and Media.
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2009 (English)In: IEEE Nuclear Science Symposium Conference Record 2009, IEEE conference proceedings, 2009, p. 1703-1706Conference paper, Published paper (Refereed)
Abstract [en]

Energy resolved X-ray imaging can be used as a tool to analyze the variation in the chemical content of an object. In this work we have used energy resolved X-ray imaging to measure the variation in the chemical content of paper and paper coating. This is an important quality parameter for the paper industry. In order to separate the variation in coating thickness from the variation in paper thickness, energy resolution is used to separate the response of the coating from the response of the paper. The MEDIPIX2 single photon processing X-ray imaging system [1] has been used in the measurements.  The measurement results are compared to simulations with MCNP. The influence of charge sharing is discussed and the effects have been studied by comparing results from detectors with 220x220 µm2 pixels and detectors with 55x55 µm2 pixels. There is a trade-off between good spatial resolution obtained with detectors with small pixels and good energy resolution obtained with detectors with large pixels. The requirements on image quality, to achieve the resolution of coating distribution relevant for the application, are discussed.

Place, publisher, year, edition, pages
IEEE conference proceedings, 2009. p. 1703-1706
Series
IEEE Nuclear Science Symposium Conference Record, ISSN 1095-7863 ; 2009
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:miun:diva-9673DOI: 10.1109/NSSMIC.2009.5402223ISI: 000280505101009Scopus ID: 2-s2.0-77951157025ISBN: 978-1-4244-3962-1 (print)OAI: oai:DiVA.org:miun-9673DiVA, id: diva2:235722
Conference
2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009; Orlando, FL; 25 October 2009 through 31 October 2009; Category number CFP09NSS; Code 79860
Available from: 2009-09-17 Created: 2009-09-17 Last updated: 2018-02-26Bibliographically approved

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Norlin, BörjeFröjdh, ChristerO'Nils, MattiasFröjdh, AnnaFröjdh, ErikThungström, Göran

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