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Multi-Path Interference Denoising of LiDAR Data Using a Deep Learning Based on U-Net Model
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).ORCID iD: 0000-0003-1840-791X
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-).ORCID iD: 0000-0002-4598-4088
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2024 (English)In: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), IEEE conference proceedings, 2024Conference paper, Published paper (Refereed)
Abstract [en]

Eliminating Multi-Path Interference (MPI) stands as a significant unresolved challenge in the domain of depth estimation using Time-of-Flight (ToF) cameras. ToF data is typically influenced by significant noise and artifacts stemming from MPI. Although a variety of conventional methods have been suggested to enhance ToF data quality, the application of machine learning techniques has been infrequent, primarily due to the scarcity of authentic training data with accurate depth information. This paper introduces an approach that eliminates the dependency on labeled real-world data within the learning framework. We employ a U-Net trained on the data with ground truth in a supervised manner, enabling it to leverage multi-frequency ToF data for MPI correction. Concurrently, we compare three channels as input with one channel and two channels. Our experimental results convincingly showcase the effectiveness of this approach in reducing noise in real-world data.

Place, publisher, year, edition, pages
IEEE conference proceedings, 2024.
Keywords [en]
depth, fusion, LiDAR, MPI, U-Net
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:miun:diva-52052DOI: 10.1109/I2MTC60896.2024.10560867ISI: 001261521400171Scopus ID: 2-s2.0-85197742945ISBN: 9798350380903 (print)OAI: oai:DiVA.org:miun-52052DiVA, id: diva2:1887387
Conference
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Available from: 2024-08-07 Created: 2024-08-07 Last updated: 2024-11-25Bibliographically approved

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Nie, YaliO'Nils, MattiasGatner, OlaShallari, Irida

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Citation style
  • apa
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