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Accuracy Impact of Increased Measurement Quality when using Pretrained Networks for Classification
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-). (STC)ORCID iD: 0000-0003-1819-6200
Mid Sweden University, Faculty of Science, Technology and Media, Department of Computer and Electrical Engineering (2023-). (STC)ORCID iD: 0000-0002-8253-7535
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2024 (English)In: Conference Record - IEEE Instrumentation and Measurement Technology Conference, IEEE conference proceedings, 2024Conference paper, Published paper (Refereed)
Abstract [en]

The field of Metrology has seen great use of Machine Learning and Deep Learning models, improving existing Metrology and enabling measurements and estimations that were previously not possible. In the challenging task of gathering training data in various areas of Metrology, a question arises; is it necessary to gather a completely new dataset every time a quality upgrade is done to a measurement system, method or model, or can the formerly trained model be used for new data with higher Signal-to-Noise Ratio (SNR)? This paper investigates how trained neural networks react to new data coming into the testing, with a higher SNR than the training data. In the experiments, Convolutional Neural Networks (CNN), in 1D and 2D, are used on heart sound data, as a test case. The initial results show that the classification accuracy for the new data, with a higher SNR, coming into the 1D CNN is almost as high as if the network had been trained on the higher SNR data. For a 2D CNN working with spectrograms instead of time series data, the change in accuracy is not nearly as high, as the 2D CNN model seems more robust to noise differences. 

Place, publisher, year, edition, pages
IEEE conference proceedings, 2024.
Keywords [en]
Classification, Data Quality, Deep Learning, Machine Learning, Neural Networks, Pretrained, SNR
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:miun:diva-52050DOI: 10.1109/I2MTC60896.2024.10561016ISI: 001261521400247Scopus ID: 2-s2.0-85197767566ISBN: 9798350380903 (print)OAI: oai:DiVA.org:miun-52050DiVA, id: diva2:1887370
Conference
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Available from: 2024-08-07 Created: 2024-08-07 Last updated: 2024-11-25Bibliographically approved

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Lundgren, JanJiang, MengNnonyelu, Chibuzo Joseph

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CiteExportLink to record
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Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
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  • de-DE
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  • en-US
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  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
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  • text
  • asciidoc
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