Reliability and Functional Analysis of IMU systems under temperature-based stress testsShow others and affiliations
2021 (English)In: Conference Record - IEEE Instrumentation and Measurement Technology Conference, Institute of Electrical and Electronics Engineers Inc. , 2021Conference paper (Refereed)
Abstract [en]
Inertial Measurement Units (IMUs) are widespread in many different applications, such as automotive, drone, robotics, smartphones, and many others. MEMS-based IMUs (i.e., IMU-based on Micro-Electro-Mechanical Systems technology) are the best solution to achieve effective and efficient monitoring and diagnostic with low cost, low power, and low dimension. The data acquired by the MEMS sensors integrated into IMUs are usually managed by suitable filtering and positioning algorithms. These algorithms are used to correct the system's attitude and vehicle path in which the IMU is installed. They also provide redundant information used for online diagnosis. Unfortunately, testing procedures specifically developed to characterize both IMU and filtering algorithms under stress are not yet available. Focusing the attention on the temperature's influence, the characterization of IMUs, considering the real scenario in which the system is operating, is a fundamental topic that must be deeply studied and discussed during a diagnostic system design. For this reason, this paper proposes a test plan for the performance analysis of MEMS-based IMUs under temperature-based stress tests. Beyond the primary analysis of reliability and functional operating, the effects of temperature miss-compensation have been evaluated on two common filtering algorithms employed for positioning applications and working on data coming from commercial IMUs implemented in the automotive field. The experimental results highlight how temperature plays a fundamental role in the behaviors of the investigated positioning algorithms. © 2021 IEEE.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2021.
Keywords [en]
Accelerometer, Diagnostic, Gyroscope, Inertial Measurement Unit, Reliability, Testing, MEMS, Microelectromechanical devices, Signal filtering and prediction, Temperature, Diagnostic systems, Effects of temperature, Efficient monitoring, Filtering algorithm, Micro electro mechanical system, Performance analysis, Positioning algorithms, Reliability analysis
Identifiers
URN: urn:nbn:se:miun:diva-43071DOI: 10.1109/I2MTC50364.2021.9459831Scopus ID: 2-s2.0-85113711960ISBN: 9781728195391 (print)OAI: oai:DiVA.org:miun-43071DiVA, id: diva2:1595675
Note
Export Date: 20 September 2021; Conference Paper; CODEN: CRIIE
2021-09-202021-09-202021-09-20Bibliographically approved