Validation of Detailed Geant4 Model for Thermal Neutron Scattering using the Results of Multi-Grid Detector Prototype Test at CNCS at SNSShow others and affiliations
2017 (English)In: 2017 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC), IEEE, 2017Conference paper, Published paper (Refereed)
Abstract [en]
The European Spallation Source (ESS) aspires to be the worlds leading neutron source of the upcoming decades, and sets the scope on replacing He-3 tube detectors where it is reasonably achievable. The Multi-Grid detector, an Ar/CO2-filled proportional chamber based on solid (B4C)-B-10 converter, is the most potent replacement technology for chopper spectroscopy. This study reproduces in a detailed Geant4 geometry of a neutron scattering instrument the data from the Multi-Grid demonstrator detector, that has been tested for a 1 year period, installed side-by-side to the He-3 tubes at the CNCS instrument at SNS. For the further understanding of the background of the detector, Monte-Carlo simulations were performed, with the ESS Coding Framework, using a Geant4 version extended with NXSG4 and NCrystal. A detailed and realistic model of the prototype was built and was validated via comparison against measured data. With this model, different sources of neutron scattering were determined and studied separately, providing a better understanding of the scattered neutron background. Due to these capabilities the model will be used in the further optimization of the detector, especially for the background reduction via shielding, which will lead to instruments with better signal-to-background ratio by design.
Place, publisher, year, edition, pages
IEEE, 2017.
Series
IEEE Nuclear Science Symposium and Medical Imaging Conference, ISSN 1095-7863
National Category
Accelerator Physics and Instrumentation
Identifiers
URN: urn:nbn:se:miun:diva-39962ISI: 000455836200338ISBN: 978-1-5386-2282-7 (print)OAI: oai:DiVA.org:miun-39962DiVA, id: diva2:1471046
Conference
IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) / 24th International Symposium on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors, OCT 21-28, 2017, Atlanta, GA
2020-09-282020-09-282020-09-28Bibliographically approved