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A ray-tracing analysis of the absorption of light by smooth and rough metal surfaces
Mid Sweden University, Faculty of Science, Technology and Media, Department of Engineering, Physics and Mathematics.
2007 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 101, no 11, article id 113504Article in journal (Refereed) Published
Abstract [en]

Ray tracing has been employed to investigate the absorption of light by smooth and random rough metal surfaces. For normally incident light the absorptance of the surface increases with surface roughness. However, for light incident at a tangent to the surface the absorptance-surface roughness relationship is more complex. For example, in certain cases the absorptance can rise, fall, and rise again as the surface roughness increases. In this paper this complex absorptance-roughness relationship is defined and explained. The wavelengths of the light chosen for this study correspond to the primary and secondary output wavelengths of Nd:YAG lasers.

Place, publisher, year, edition, pages
2007. Vol. 101, no 11, article id 113504
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:miun:diva-8462DOI: 10.1063/1.2738417ISI: 000247306000031Scopus ID: 2-s2.0-34250671633OAI: oai:DiVA.org:miun-8462DiVA, id: diva2:139820
Available from: 2009-01-26 Created: 2009-01-26 Last updated: 2017-12-14Bibliographically approved
In thesis
1. The Absorption of Laser Light by Rough Metal Surfaces
Open this publication in new window or tab >>The Absorption of Laser Light by Rough Metal Surfaces
2008 (English)Doctoral thesis, comprehensive summary (Other academic)
Series
Doctoral thesis / Luleå University of Technology, ISSN 1402-1544 ; 2008:08
Keywords
absorptance, reflectance, laser, metals, roughness, integrating sphere
National Category
Materials Engineering
Identifiers
urn:nbn:se:miun:diva-6878 (URN)6064 (Local ID)6064 (Archive number)6064 (OAI)
Public defence
(English)
Available from: 2008-11-03 Created: 2008-11-03 Last updated: 2009-03-10Bibliographically approved

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Bergström, David

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