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The PERCIVAL soft X-ray Detector
DESY (Deutsches Elektronensynchrotron), Hamburg, Germany; CFEL Center for Free-Electron Laser Science, Hamburg, Germany.
DESY (Deutsches Elektronensynchrotron), Hamburg, Germany; CFEL Center for Free-Electron Laser Science, Hamburg, Germany.
DESY (Deutsches Elektronensynchrotron), Hamburg, Germany; CFEL Center for Free-Electron Laser Science, Hamburg, Germany.
DESY (Deutsches Elektronensynchrotron), Hamburg, Germany; CFEL Center for Free-Electron Laser Science, Hamburg, Germany.
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2018 (English)In: 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings, Institute of Electrical and Electronics Engineers (IEEE), 2018, article id 8824727Conference paper, Published paper (Refereed)
Abstract [en]

The PERCIVAL collaboration to develop a soft X-ray imager able to address the challenges of high brilliance light sources, such as new-generation synchrotrons and Free Electron Lasers, has reached one of its major milestones: a full 2-MegaPixel (P2M) system (uninterrupted 4 × 4 cm2 active area) has already seen its first light.Smaller prototypes of the device, a monolithic active pixel sensor based on CMOS technology, have already been fully characterised, and have demonstrated high frame rate, large dynamic range, and relatively high quantum efficiency.The PERCIVAL modular layout allows for clover-leaf like arrangement of up to four P2M systems. Moreover, it will be post-processed in order to achieve a high quantum efficiency in its primary energy range (250 eV to 1 keV).We will present the P2M system, its status and newest results, bring these in context with achieved prototype performance, and outline future steps. 

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2018. article id 8824727
National Category
Physical Sciences
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URN: urn:nbn:se:miun:diva-37675DOI: 10.1109/NSSMIC.2018.8824727Scopus ID: 2-s2.0-85073109548ISBN: 9781538684948 (print)OAI: oai:DiVA.org:miun-37675DiVA, id: diva2:1370197
Conference
2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018, 10 November 2018 through 17 November 2018
Available from: 2019-11-14 Created: 2019-11-14 Last updated: 2019-11-14Bibliographically approved

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Graafsma, Heinz

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