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Using a SVD-based algorithm for T2 spectrum calculation in TD-NMR application to detect hidden defects in hazelnuts
Univ. of Salerno.
Univ. of Salerno.
Univ. of Salerno.
Univ. of Salerno.
2017 (English)In: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2017, p. 1-6Conference paper, Published paper (Refereed)
Abstract [en]

Hazelnuts are widely used into the confectionary industry for their flavour and taste. Nondestructive techniques are required to detect the quality of the nuts in shell with the aim of avoiding putting a poor product into the market chain. In this work, Time Domain - NMR (TD-NMR) has been employed to detect hidden defects in hazelnuts in shell. In particular, the Carr-Purcell-Meiboom-Gill (CPMG) technique has been used to evaluate the transverse relaxation times, T<sub>2</sub>, for healthy and unhealthy hazelnuts, highlighting the differences between them. An index that takes in account the different time constants of the transverse relaxation curve has been defined to establish a classification method for the hazelnuts. The results of this work provide a basis for the development of a measurement system for inline inspection of hazelnuts in shell.

Place, publisher, year, edition, pages
2017. p. 1-6
Keywords [en]
agricultural products, flaw detection, food products, nuclear magnetic resonance, quality control, singular value decomposition, spectral analysis, Carr-Purcell-Meiboom-Gill technique, SVD based algorithm, T2 spectrum calculation, TD-NMR application, confectionary industry, hazelnut hidden defect detection, market chain, time domain NMR, transverse relaxation times, unhealthy hazelnut, Erbium, Instrumentation and measurement, NMR, defect detection, digital signal processing, food quality, multi-exponential inversion
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-33324DOI: 10.1109/I2MTC.2017.7969849Scopus ID: 2-s2.0-85026784051OAI: oai:DiVA.org:miun-33324DiVA, id: diva2:1192259
Conference
2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Available from: 2018-03-22 Created: 2018-03-22 Last updated: 2021-04-28Bibliographically approved

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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf