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Precision scan-imaging for paperboard quality inspection utilizing X-ray fluorescence
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design. (STC)ORCID iD: 0000-0001-9334-3958
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design. (STC)
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design. (STC)ORCID iD: 0000-0002-8325-5177
Process Technology Department, MoRe Research, Örnsköldsvik.
2018 (English)In: Journal of Instrumentation, E-ISSN 1748-0221, Vol. 13, no 1, article id C01021Article in journal (Refereed) Published
Abstract [en]

Paperboard is typically made up of a core of cellulose fibers [C6H10O5] and a coating layer of [CaCO3]. The uniformity of these layers is a critical parameter for the printing quality. Current quality control methods include chemistry based visual inspection methods as well as X-ray based methods to measure the coating thickness. In this work we combine the X-ray fluorescence signals from the Ca atoms (3.7 keV) in the coating and from a Cu target (8.0 keV) placed behind the paper to simultaneously measure both the coating and the fibers. Cu was selected as the target material since its fluorescence signal is well separated from the Ca signal while its fluorescence's still are absorbed sufficiently in the paper. A laboratory scale setup is built using stepper motors, a silicon drift detector based spectrometer and a collimated X-ray beam. The spectroscopic image is retrieved by scanning the paperboard surface and registering the fluorescence signals from Ca and Cu. The exposure time for this type of setups can be significantly improved by implementing spectroscopic imaging sensors. The material contents in the layers can then be retrieved from the absolute and relative intensities of these two signals.

Place, publisher, year, edition, pages
IOP Publishing , 2018. Vol. 13, no 1, article id C01021
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-32724DOI: 10.1088/1748-0221/13/01/C01021ISI: 000422899200004Scopus ID: 2-s2.0-85041817589OAI: oai:DiVA.org:miun-32724DiVA, id: diva2:1176472
Conference
19th International Workshop on Radiation Imaging Detectors (IWORID2017), Krakow, Poland, 2-6 July, 2017
Available from: 2018-01-22 Created: 2018-01-22 Last updated: 2024-07-04Bibliographically approved

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Norlin, BörjeReza, SalimFröjdh, Christer

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