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X-ray fluorescence measurements of toxic metal content in ash from municipal solid waste incineration
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design. FS-DS, Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany.
Mid Sweden University, Faculty of Science, Technology and Media, Department of Electronics Design.ORCID iD: 0000-0002-8325-5177
2017 (English)In: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), IEEE, 2017, Vol. 2017-January, article id 8069695Conference paper, Published paper (Refereed)
Abstract [en]

The vision of this paper is development of an online X-ray fluorescence method for monitoring of metal content in ash from municipal solid waste (MSW) incineration. With such measurements directly on site it is possible to optimize an ash washing process in incineration plants, allowing the fly ash to be stored in a landfill for non-hazardous waste. The presented X-ray fluorescence measurement assures that the measurement accuracy is sufficient for metal content monitoring. The actual measurement process is also fast enough to be possible to implement as an online measurement method. The optimal measurement setup is different for different metals. Several different metals might need environmental monitoring, which metals might vary over time due to systematic variations in waist content. Detection of a wide range of metals will require an X-ray source with variable voltage and multiple detectors.

Place, publisher, year, edition, pages
IEEE, 2017. Vol. 2017-January, article id 8069695
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:miun:diva-31947DOI: 10.1109/NSSMIC.2016.8069695ISI: 000432419500317Scopus ID: 2-s2.0-85041723656OAI: oai:DiVA.org:miun-31947DiVA, id: diva2:1152281
Conference
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, France, 29 Oct.-6 Nov. 2016
Available from: 2017-10-24 Created: 2017-10-24 Last updated: 2020-09-25Bibliographically approved

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Publisher's full textScopushttp://ieeexplore.ieee.org/abstract/document/8069695/?reload=true

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Norlin, BörjeReza, SalimFröjdh, Christer

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