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Probing Defects in a Small Pixellated CdTe Sensor Using an Inclined Mono Energetic X-Ray Micro Beam
Mittuniversitetet, Fakulteten för naturvetenskap, teknik och medier, Institutionen för informationsteknologi och medier. (Radiation detection)
Mittuniversitetet, Fakulteten för naturvetenskap, teknik och medier, Institutionen för informationsteknologi och medier. (Radiation Detectors)ORCID-id: 0000-0002-8325-5177
Diamond Light Source.
Mittuniversitetet, Fakulteten för naturvetenskap, teknik och medier, Institutionen för informationsteknologi och medier. (Radiation Detectors)ORCID-id: 0000-0002-5619-409X
Vise andre og tillknytning
2012 (engelsk)Inngår i: 2012 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE RECORD (NSS/MIC), IEEE conference proceedings, 2012, s. 4233-4236, artikkel-id 6551965Konferansepaper, Publicerat paper (Annet vitenskapelig)
Abstract [en]

High quantum efficiency is important in X-ray imaging applications. This means using high-Z sensor materials. Unfortunately many of these materials suffer from defects that cause non-ideal charge transport. In order to increase the understanding of these defects, we have mapped the 3D response of a number of defects in two 1 mm thick CdTe sensors with different pixel sizes (55 mu m and 110 mu m) using a monoenergetic microbeam at 79 keV. The sensors were bump bonded to Timepix read out chips. Data was collected in photon counting as well as time-over-threshold mode. The time-over-threshold mode is a very powerful tool to investigate charge transport properties and fluorescence in pixellated detectors since the signal from the charge that each photon deposits in each pixel can be analyzed. Results show distorted electrical field around the defects and indications of excess leakage current and large differences in behavior between electron collection and hole collection mode. The experiments were carried out in the Extreme Conditions Beamline I15 at Diamond Light Source.

sted, utgiver, år, opplag, sider
IEEE conference proceedings, 2012. s. 4233-4236, artikkel-id 6551965
Serie
IEEE Nuclear Science Symposium Conference Record, ISSN 1082-3654
HSV kategori
Identifikatorer
URN: urn:nbn:se:miun:diva-17568ISI: 000326814204069Scopus ID: 2-s2.0-84881576398Lokal ID: STCISBN: 978-1-4673-2030-6 (tryckt)ISBN: 978-1-4673-2028-3 (tryckt)OAI: oai:DiVA.org:miun-17568DiVA, id: diva2:573786
Konferanse
IEEE Nuclear Science Symposium / Medical Imaging Conference Record (NSS/MIC) / 19th Room-Temperature Semiconductor X-ray and Gamma-ray Detector Workshop
Tilgjengelig fra: 2012-12-03 Laget: 2012-12-03 Sist oppdatert: 2016-10-20bibliografisk kontrollert
Inngår i avhandling
1. Hybrid pixel detectors: Characterization and optimization
Åpne denne publikasjonen i ny fane eller vindu >>Hybrid pixel detectors: Characterization and optimization
2015 (engelsk)Doktoravhandling, med artikler (Annet vitenskapelig)
sted, utgiver, år, opplag, sider
Sundsvall: Mid Sweden University, 2015. s. 209
Serie
Mid Sweden University doctoral thesis, ISSN 1652-893X ; 228
HSV kategori
Identifikatorer
urn:nbn:se:miun:diva-26794 (URN)STC (Lokal ID)978-91-88025-37-1 (ISBN)STC (Arkivnummer)STC (OAI)
Disputas
2015-09-08, O102, Sundsvall, 13:00 (engelsk)
Veileder
Merknad

Vid tidpunkten för disputationen var följande delarbete opublicerat: delarbete 8 inskickat.

At the time of the doctoral defence the following paper was unpublished: paper 8 submitted.

Tilgjengelig fra: 2016-01-04 Laget: 2016-01-04 Sist oppdatert: 2018-09-10bibliografisk kontrollert

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Fröjdh, ErikFröjdh, ChristerKrapohl, DavidNorlin, BörjeThungström, Göran

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