Monte Carlo simulation of the imaging properties of scintillator-coated X-ray pixel detetectorsShow others and affiliations
Responsible organisation
2003 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 509, no 1-3, p. 76-85Article in journal (Refereed) Published
Abstract [en]
The spatial resolution of scintillator-coated X-ray pixel detectors is usually limited by the isotropic light spread in the scintillator. One way to overcome this limitation is to use a pixellated scintillating layer on top of the semiconductor pixel detector. Using advanced etching and filling techniques, arrays of CsI columns have been successfully fabricated and characterized. Each CsI waveguide matches one pixel of the semiconductor detector, limiting the spatial spread of light. Another concept considered in this study is to detect the light emitted from the scintillator by diodes formed in the silicon pore walls. There is so far no knowledge regarding the theoretical limits for these two approaches, which makes the evaluation of the fabrication process difficult. In this work we present numerical calculations of the signal-to-noise ratio (SNR) for detector designs based on scintillator-filled pores in silicon. The calculations are based on separate Monte Carlo (MC) simulations of X-ray absorption and light transport in scintillator waveguides. The resulting data are used in global MC simulations of flood exposures of the detector array, from which the SNR values are obtained. Results are presented for two scintillator materials, namely CsI(Tl) and GADOX.
Place, publisher, year, edition, pages
2003. Vol. 509, no 1-3, p. 76-85
Keywords [en]
X-ray detectors, pixel detectors, imaging, Monte Carlo
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:miun:diva-1576DOI: 10.1016/S0168-9002(03)01553-5ISI: 000185047700014Scopus ID: 2-s2.0-0041728665Local ID: 684OAI: oai:DiVA.org:miun-1576DiVA, id: diva2:26608
Conference
4th International Workshop on Radiation Imaging Detectors, Sep 08-12, 2002, Amsterdam, Netherlands
Note
4th International Workshop on Radiation Imaging Detectors, Sep 08-12, 2002, Amsterdam, Netherlands
2008-09-302008-09-302017-12-13Bibliographically approved