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Abdallah, Munir
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Publications (10 of 11) Show all publications
Marchal, J., Al-Ajili, A., Scott, J., Doak, D., Abdalla, M., Gwilliam, R., . . . Rahman, M. (2003). A new pixel sensor for uniformity control in ion implantation. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 206, 462-466
Open this publication in new window or tab >>A new pixel sensor for uniformity control in ion implantation
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2003 (English)In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, ISSN 0168-583X, E-ISSN 1872-9584, Vol. 206, p. 462-466Article in journal (Refereed) Published
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8260 (URN)10.1016/S0168-583X(03)00794-8 (DOI)000183690500102 ()
Available from: 2009-01-15 Created: 2009-01-15 Last updated: 2017-12-14Bibliographically approved
Lundgren, J., Oelmann, B., Ytterdal, T., Eriksson, P., Abdalla, M. & O'Nils, M. (2003). A power-line noise coupling estimation methodology for architectural exploration of mixed-signal systems. In: Proceedings of the Southwest Symposium on Mixed-Signa Design: . Paper presented at Southwest Symposium on Mixed-Signal Design, Feb 23-25, 2003, Las Vegas, NV (pp. 133-137). IEEE Press, Article ID 1190412.
Open this publication in new window or tab >>A power-line noise coupling estimation methodology for architectural exploration of mixed-signal systems
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2003 (English)In: Proceedings of the Southwest Symposium on Mixed-Signa Design, IEEE Press, 2003, p. 133-137, article id 1190412Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents methods for early estimation of digital to analog noise coupling over the power distribution network in mixed-signal systems. The methods allow both behavioral verification of mixed-signal architectures and their sensitivity to noise coupling of the power distribution network. The behavioral level noise coupling simulation models are implemented as extensions to the SystemC system design language. To illustrate the effectiveness of the proposed methods, we have estimated the power distribution network noise for a photon-counting X-ray pixel array and compared this with SPICE simulations.

Place, publisher, year, edition, pages
IEEE Press, 2003
Keywords
Noise Coupling, Power Distribution Networks, SystemC
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-1655 (URN)10.1109/SSMSD.2003.1190412 (DOI)000181754900027 ()2-s2.0-84942518357 (Scopus ID)277 (Local ID)0-7803-7778-8 (ISBN)277 (Archive number)277 (OAI)
Conference
Southwest Symposium on Mixed-Signal Design, Feb 23-25, 2003, Las Vegas, NV
Available from: 2008-09-30 Created: 2009-01-07 Last updated: 2020-01-29Bibliographically approved
Lundgren, J., Oelmann, B., Ytterdal, T., Eriksson, P., Abdalla, M. & O´Nils, M. (2003). Behavioral Simulation of Power Line Noise Coupling in Mixed-Signal Systems using SystemC. In: ISVLSI 2003: IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS - NEW TRENDS AND TECHNOLOGIES FOR VLSI SYSTEMS DESIGN. Paper presented at IEEE-Computer-Society Annual Symposium on VLSI, Feb 20-21, 2003, Tampa, FL (pp. 275-277). IEEE
Open this publication in new window or tab >>Behavioral Simulation of Power Line Noise Coupling in Mixed-Signal Systems using SystemC
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2003 (English)In: ISVLSI 2003: IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS - NEW TRENDS AND TECHNOLOGIES FOR VLSI SYSTEMS DESIGN, IEEE , 2003, p. 275-277Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents methods for early quantification of digital to analog noise coupling at behavioral level. The methods enable designers to both verify the behavior of their mixed-signal architecture and its sensitivity to noise coupling. The high-level noise coupling simulation models are implemented as extensions to SystemC.

Place, publisher, year, edition, pages
IEEE, 2003
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8053 (URN)000181626500054 ()0-7695-1904-0 (ISBN)
Conference
IEEE-Computer-Society Annual Symposium on VLSI, Feb 20-21, 2003, Tampa, FL
Available from: 2009-01-07 Created: 2009-01-07 Last updated: 2020-01-29Bibliographically approved
Marchal, J., Passmore, M. S., Abdalla, M., van den Berg, J., Nejim, A., Fröjdh, C., . . . Rahman, M. (2002). Active pixel detector for ion beam profiling. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 487(1-2), 224-231
Open this publication in new window or tab >>Active pixel detector for ion beam profiling
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2002 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 487, no 1-2, p. 224-231Article in journal (Refereed) Published
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8266 (URN)10.1016/S0168-9002(02)00969-5 (DOI)000177177500034 ()
Note
3rd International Workshop on Radiation Imaging Detectors, Sep 23-27, 2001, Orosei, ItalyAvailable from: 2009-01-15 Created: 2009-01-15 Last updated: 2017-12-14Bibliographically approved
O'Nils, M., Abdalla, M. & Oelmann, B. (2002). Low Digital Interference Counter for Photon Counting Pixel Detectors. Nuclear Instruments and Methods in Physics Research, Section A, 487(3), 323-330
Open this publication in new window or tab >>Low Digital Interference Counter for Photon Counting Pixel Detectors
2002 (English)In: Nuclear Instruments and Methods in Physics Research, Section A, ISSN 0168-9002, Vol. 487, no 3, p. 323-330Article in journal (Refereed) Published
Abstract [en]

Single photon-counting pixel sensors are widely used in radiation imaging because of their energy resolving capability and high dynamic range. However, the close integration of the analog and digital circuits in the small pixel area puts critical constraints on the mixed mode circuit design. This includes the design considerations regarding the noise injection from the digital circuits into the analog part due to the digital switching. In addition, the large number of components requires a pixel circuit with low power consumption. In this paper, we address these two design constraints. An event counter architecture that decreases the digital switching and power consumption in a pixel is presented. The counter has the same dynamic range for capturing events and hardware cost as the conventionally used counters. We present design rules for adopting the counter architecture to a certain application. These rules enable the trade-off between readout accuracy from the pixel vs. the current in the digital parts of the pixel. Simulation of a case study circuit shows a reduction of digital activity by a factor seven, and a significant reduction of power consumption.

Keywords
X-ray image detector, Detector electronics
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-1673 (URN)10.1016/S0168-9002(01)02188-X (DOI)000177920400008 ()2-s2.0-0037151192 (Scopus ID)308 (Local ID)308 (Archive number)308 (OAI)
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2020-01-29Bibliographically approved
Oelmann, B., Abdalla, M. & O'Nils, M. (2002). Robust window discriminator for photon-counting pixel detectors. IEE Proceedings - Optoelectronics, 149(2), 65-69
Open this publication in new window or tab >>Robust window discriminator for photon-counting pixel detectors
2002 (English)In: IEE Proceedings - Optoelectronics, ISSN 1350-2433, Vol. 149, no 2, p. 65-69Article in journal (Refereed) Published
Abstract [en]

The paper proposes a robust and area-efficient way of designing window discriminators for photon-counting pixel detectors. For that, an all-digital window discriminator is proposed. It is event-driven and does not rely on any external or internal timing references, which makes it possible to use it over a wide range of specifications. In addition, it provides an overall area efficient implementation of the digital electronics in photon-counting pixel detectors. The transistor-level implementation of the circuit is presented with its circuit area and timing performance.

Keywords
x-ray pixel detector, asynchrnonous
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-1832 (URN)10.1049/ip-opt:20020437 (DOI)000177099100004 ()2-s2.0-0036529141 (Scopus ID)587 (Local ID)587 (Archive number)587 (OAI)
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2020-01-29Bibliographically approved
Abdalla, M. A., Fröjdh, C. & Petersson, S. (2001). A CMOS APS for dental X-ray imaging using scintillating sensors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 460(1), 197-203
Open this publication in new window or tab >>A CMOS APS for dental X-ray imaging using scintillating sensors
2001 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 460, no 1, p. 197-203Article in journal (Refereed) Published
Abstract [en]

In this paper we present an integrating CMOS Active Pixel Sensor (APS) circuit to be used with scintillator type X-ray sensors for intra oral dental X-ray imaging systems. Different pixel architectures were constructed to explore their performance characteristics and to study the feasibility of the development of such systems using the CMOS technology. A prototype 64×80 pixel array has been implemented in a CMOS 0.8 μm double poly n-well process with a pixel pitch of 50 μm. A spectral sensitivity measurement for the different pixels topologies, as well as measured X-ray direct absorption in the different APSs are presented. A measurement of the output signal showed a good linearity over a wide dynamic range. This chip showed that the very low sensitivity of the CMOS APSs to direct X-ray exposure adds a great advantage to the various CMOS advantages over CCD-based imaging systems.

National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8274 (URN)10.1016/S0168-9002(00)01114-1 (DOI)000167597000028 ()0342592353 (Scopus ID)
Note
1st International Workshop on Radiation Imaging Detectors, Jun 13-17, 1999, Sundsvall, SwedenAvailable from: 2009-01-15 Created: 2009-01-15 Last updated: 2017-12-14Bibliographically approved
Abdalla, M., Dubaric, E., Nilsson, H.-E., Fröjdh, C. & Petersson, S. (2001). A scintillator-coated phototransistor pixel sensor with dark current cancellation. In: cecs2001: 8th IEEE international conference on electronics, circuits and systems, Vols. I-III, Conference Proceedings (pp. 663-667).
Open this publication in new window or tab >>A scintillator-coated phototransistor pixel sensor with dark current cancellation
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2001 (English)In: cecs2001: 8th IEEE international conference on electronics, circuits and systems, Vols. I-III, Conference Proceedings, 2001, p. 663-667Conference paper, Published paper (Other academic)
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8263 (URN)
Available from: 2009-01-15 Created: 2009-01-15 Last updated: 2016-10-05Bibliographically approved
Abdalla, M. A., Fröjdh, C. & Petersson, S. (2001). An integrating CMOS APS for X-ray imaging with an in-pixel preamplifier. Paper presented at 2nd International Workshop on Radiation Imaging Detectors; Freiburg; Germany; 2 July 2000 through 6 July 2000. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 466(1), 232-236
Open this publication in new window or tab >>An integrating CMOS APS for X-ray imaging with an in-pixel preamplifier
2001 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 466, no 1, p. 232-236Article in journal (Refereed) Published
Abstract [en]

We present in this paper an integrating CMOS Active Pixel Sensor (APS) circuit coated with scintillator type sensors for intra-oral dental X-ray imaging systems. The photosensing element in the pixel is formed by the p-diffusion on the n-well diode. The advantage of this photosensor is its very low direct absorption of X-rays compared to the other available photosensing elements in the CMOS pixel. The pixel features an integrating capacitor in the feedback loop of a preamplifier of a finite gain in order to increase the optical sensitivity. To verify the effectiveness of this in-pixel preamplification, a prototype 32 x 80 element CMOS active pixel array was implemented in a 0.8 mum CMOS double poly, n-well process with a pixel pitch of 50 mum. Measured results confirmed the improved optical sensitivity performance of the APS. Various measurements on device performance are presented.

National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8268 (URN)10.1016/S0168-9002(01)00850-6 (DOI)000169789200035 ()2-s2.0-0035927773 (Scopus ID)
Conference
2nd International Workshop on Radiation Imaging Detectors; Freiburg; Germany; 2 July 2000 through 6 July 2000
Note

2nd International Workshop on Radiation Imaging Detectors, Jul 02-06, 2000, Freiburg, Germany

Available from: 2009-01-15 Created: 2009-01-15 Last updated: 2017-12-14Bibliographically approved
Abdalla, M. A., Fröjdh, C. & Petersson, S. (2000). A new biasing method for CMOS preamplifier-shapers. In: ICECS 2000: 7TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS & SYSTEMS, VOLS I AND II (pp. 15-18).
Open this publication in new window or tab >>A new biasing method for CMOS preamplifier-shapers
2000 (English)In: ICECS 2000: 7TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS & SYSTEMS, VOLS I AND II, 2000, p. 15-18Conference paper, Published paper (Refereed)
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8267 (URN)
Available from: 2009-01-15 Created: 2009-01-15 Last updated: 2011-04-04Bibliographically approved
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