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Persson, U.
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Publications (7 of 7) Show all publications
Persson, U. (2006). Surface roughness measurement on machined surfaces using angular speckle correlation. Journal of Materials Processing Technology, 180(1-3), 233-238
Open this publication in new window or tab >>Surface roughness measurement on machined surfaces using angular speckle correlation
2006 (English)In: Journal of Materials Processing Technology, ISSN 0924-0136, E-ISSN 1873-4774, Vol. 180, no 1-3, p. 233-238Article in journal (Refereed) Published
Abstract [en]

Surface roughness is of great importance in fields, such as tribology, semiconductor technology and medicine. Stylus techniques, in which a stylus is drawn along the surface and the vertical movement of the stylus is recorded, have been used traditionally in measuring surface roughness. Non-contact methods, such as optical ones, have the advantage that they can be used for the in-process measurement of surface roughness. In this paper, results of the measurement of surface roughness using angular speckle-correlation on machined surfaces are presented. Surfaces of approximately 1.6 < R-a < 6.3 mu m have been measured, the surfaces being classified in the same manner as when using a stylus instrument. ASC is a technique that also allows in-process measurement of the roughness of surfaces on machined surfaces. A new technique to achieve increased repeatability by using an angle detection unit is also presented in this paper. (c) 2006 Elsevier B.V. All rights reserved.

National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-8679 (URN)10.1016/j.jmatprotec.2006.06.010 (DOI)000240759900033 ()
Available from: 2009-02-26 Created: 2009-02-26 Last updated: 2017-12-13Bibliographically approved
Dejanovic, S., Persson, U., Kuttainen, S. & Westerfur, L. (2005). Measurement of Electrical Parameters Using Mixed-Signal Test Bus, IEEE Std. 1149.4. Measurement, 37(3), 260-277
Open this publication in new window or tab >>Measurement of Electrical Parameters Using Mixed-Signal Test Bus, IEEE Std. 1149.4
2005 (English)In: Measurement, ISSN 0263-2241, Vol. 37, no 3, p. 260-277Article in journal (Refereed) Published
Abstract [en]

Test Access Port and Boundary-Scan Architecture, IEEE Std. 1149.1, was developed to ease the test of printed circuit board assemblies (PCBAs). The development of packaging technology and the increasing functionality of a circuit have made traditional testing methods, such as in-circuit tests and functional testing through edge connectors much more difficult or even impossible. Mixed-Signal Test Bus, IEEE Std. 1149.4, which is a further development of IEEE Std. 1149.1 has been developed to enable the testing of analog components and analog interconnects on PCBAs. IEEE Std. 1149.4 compliant circuits contain an analog bus and analog switches. Techniques applicable to the measurement of impedances via IEEE Std. 1149.4 compliant circuits are presented. A filter has been tested and the results are promising. It has been shown by both measurement and simulation that switching impedances can be managed in such a manner that the influence of deviations from their nominal value can be estimated.

Keywords
Boundary Scan, Analog Boundary Scan, Mixed-Signal Test Bus, 1149.4
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-2959 (URN)10.1016/j.measurement.2004.12.002 (DOI)000229131500006 ()2694 (Local ID)2694 (Archive number)2694 (OAI)
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2011-04-05Bibliographically approved
Persson, U. (2004). Estimate of measurement uncertainty using analog switches in electronic test. In: Proccedings of the 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004: . Paper presented at 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004; St. Petersburg; Russian Federation; 30 June 2004 through 2 July 2004 (pp. 184-188).
Open this publication in new window or tab >>Estimate of measurement uncertainty using analog switches in electronic test
2004 (English)In: Proccedings of the 10th IMEKO TC7 Symposium on Advances of Measurement Science 2004, 2004, p. 184-188Conference paper, Published paper (Refereed)
Identifiers
urn:nbn:se:miun:diva-24548 (URN)2-s2.0-84910012235 (Scopus ID)978-163439188-7 (ISBN)
Conference
10th IMEKO TC7 Symposium on Advances of Measurement Science 2004; St. Petersburg; Russian Federation; 30 June 2004 through 2 July 2004
Available from: 2015-03-12 Created: 2015-03-12 Last updated: 2015-04-10Bibliographically approved
Karlsson, M., Persson, U. & Haglund, D. (2004). Evaluation of Thermal Imaging and Simulation Applicable to Testing of Printed Board Assemblies. In: THERMINIC 2004 10th international workshop on THERmal INvestigations of ICs and Systems: 29 September - 1 October 2004, Sophia Antipolis, Côte d'Azur, France. (pp. 119-129). Grenoble: Laboratoire TIMA
Open this publication in new window or tab >>Evaluation of Thermal Imaging and Simulation Applicable to Testing of Printed Board Assemblies
2004 (English)In: THERMINIC 2004 10th international workshop on THERmal INvestigations of ICs and Systems: 29 September - 1 October 2004, Sophia Antipolis, Côte d'Azur, France., Grenoble: Laboratoire TIMA , 2004, p. 119-129Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents a non-contact method for making relative measurements of the resistance of surface mounted resistors. An application of this technique is in automatic test equipment, i.e. within the limitations of resolution and accuracy of the measuring system it is possible to detect if incorrect resistor values are mounted on a printed board assembly. Measurements are made on two specially designed test boards. Two different measurement systems are used of which one is based on thermopiles and the other is a heat camera equipped with a QWIP (Quantum Well Intersubband Photodetector) detector. The detection of a minimum change of resistance, corresponding to a change of approximately 5 mW in dissipated electrical power, was achieved. Simulations of resistor board systems using; THERMIC 6.6, THERMICPCB 6.6, and Flotherm 3.2; and a dissipation power model are presented as a demonstration of predictions of the thermal fingerprint of a circuit board.

Place, publisher, year, edition, pages
Grenoble: Laboratoire TIMA, 2004
Keywords
Thermopile, QWIP, heat radiation, non-contact measurement, thermal simulation
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-2922 (URN)2607 (Local ID)2-84813-036-9 (ISBN)2607 (Archive number)2607 (OAI)
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2011-04-28Bibliographically approved
Persson, U. (2003). Uncertainty of Measurement in Testing Analog and Mixed Signal Units using Analog Switches. In: Proc. of the Electronic Devices and Systems Conference, Brno, 2003..
Open this publication in new window or tab >>Uncertainty of Measurement in Testing Analog and Mixed Signal Units using Analog Switches
2003 (Swedish)In: Proc. of the Electronic Devices and Systems Conference, Brno, 2003., 2003Conference paper, Published paper (Other scientific)
Keywords
Uncertainty, Analog Switches
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-1684 (URN)1236 (Local ID)1236 (Archive number)1236 (OAI)
Available from: 2008-09-30 Created: 2008-09-30Bibliographically approved
Persson, U. (2002). Surface Roughness Measurement on Machined Surfaces using Angular Speckle Correlation. Östersund: Mid Sweden University, Dept. of IT and Media
Open this publication in new window or tab >>Surface Roughness Measurement on Machined Surfaces using Angular Speckle Correlation
2002 (English)Report (Other scientific)
Place, publisher, year, edition, pages
Östersund: Mid Sweden University, Dept. of IT and Media, 2002
Keywords
Roughness, speckle
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-2152 (URN)1238 (Local ID)1238 (Archive number)1238 (OAI)
Available from: 2008-09-30 Created: 2008-09-30Bibliographically approved
Dejanovic, S., Kuttainen, S., Persson, U. & Westerfur, L. (2001). Measurement of electrical parameters using Mixed-Signal Test Bus, IEEE Std. 1149.4. Östersund: Dept. of IT, Mid Sweden University
Open this publication in new window or tab >>Measurement of electrical parameters using Mixed-Signal Test Bus, IEEE Std. 1149.4
2001 (English)Report (Other academic)
Place, publisher, year, edition, pages
Östersund: Dept. of IT, Mid Sweden University, 2001
Keywords
1149.4
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-2053 (URN)1239 (Local ID)1239 (Archive number)1239 (OAI)
Available from: 2008-09-30 Created: 2008-09-30 Last updated: 2011-04-05Bibliographically approved
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