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Publications (10 of 92) Show all publications
Rezasson, R., Zhou, T., Burvall, A., Lindgren, J., Fröjdh, C., Hertz, H. M. & Norlin, B. (2023). A fast and non-destructive alternative to the burnout method for paperboard quality inspections using phase-contrast X-ray imaging. TAPPI Journal, 22(2), 99-106
Open this publication in new window or tab >>A fast and non-destructive alternative to the burnout method for paperboard quality inspections using phase-contrast X-ray imaging
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2023 (English)In: TAPPI Journal, ISSN 0734-1415, Vol. 22, no 2, p. 99-106Article in journal (Refereed) Published
Abstract [en]

An X-ray based quality inspection method for paperboard was implemented and tested as a fast and non-destructive alternative to the burnout method. An argument against X-ray imaging for inspection of paper and paperboard has been that X-ray absorption is low in paper. To overcome this limitation, we used phase-contrast X-ray imaging (PCXI), which gives higher contrast than conventional attenuation-based imaging for low-absorbing materials such as paper. The suggested PCXI method was applied to previously prepared and quality rated samples using the burnout method. A strong similarity between the burnout images and the PCXI images was observed. In conclusion, further development of the phase-contrast X-ray method would provide an interesting option for replacing or complementing the standard burnout method.

National Category
Radiology, Nuclear Medicine and Medical Imaging Paper, Pulp and Fiber Technology
Identifiers
urn:nbn:se:miun:diva-47773 (URN)10.32964/tj22.2.99 (DOI)
Available from: 2023-03-10 Created: 2023-03-10 Last updated: 2023-03-10Bibliographically approved
Gao, T., Da Via, C., Bergmann, B., Burian, P., Fröjdh, C. & Pospisil, S. (2021). Response of 3D Sensor Coupled with Timepix3 Detector in Mixed Relativistic Heavy Ion Beam. In: 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2021 and 28th International Symposium on Room-Temperature Semiconductor Detectors, RTSD 2022: . Paper presented at 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2021, 16 October 2021 through 23 October 2021. IEEE
Open this publication in new window or tab >>Response of 3D Sensor Coupled with Timepix3 Detector in Mixed Relativistic Heavy Ion Beam
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2021 (English)In: 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2021 and 28th International Symposium on Room-Temperature Semiconductor Detectors, RTSD 2022, IEEE, 2021Conference paper, Published paper (Refereed)
Abstract [en]

The response of a Timepix3 detector with a partial-3D silicon sensor (electrodes partially penetrating the silicon substrate) was studied in a relativistic charged particle beam at the Super-Proton-Synchrotron at the European Center for Particle Physics (CERN). The detector was placed in a mixed ion beam produced by a 330 GeV/c lead ion beam hitting a beryllium target. The spectra of energy loss and 2D tracks from the ions impinging the detector at different angles of incidence are presented and analysed. It was shown that the detector can distinguish ions of charge up to z = 6 for angles of incidence greater than 50°, and ions of charges up to z = 5 when the incident angle was as low as 25°. We observed the volcano effect in the 3D Timepix3 detector, and a maximum of 800 keV per pixel energy was recorded. Charge carriers created in the volume without electrodes were found to have drift times up to 210 ns. 

Place, publisher, year, edition, pages
IEEE, 2021
National Category
Subatomic Physics
Identifiers
urn:nbn:se:miun:diva-46305 (URN)10.1109/NSS/MIC44867.2021.9875827 (DOI)2-s2.0-85139092417 (Scopus ID)9781665421133 (ISBN)
Conference
2021 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2021, 16 October 2021 through 23 October 2021
Available from: 2022-10-18 Created: 2022-10-18 Last updated: 2025-02-14Bibliographically approved
An, S., Reza, S., Norlin, B., Fröjdh, C. & Thungström, G. (2021). Signal-to-Noise Ratio Optimization in X-ray Fluorescence Spectrometry for Chromium Contamination Analysis. Talanta: The International Journal of Pure and Applied Analytical Chemistry, 230, Article ID 122236.
Open this publication in new window or tab >>Signal-to-Noise Ratio Optimization in X-ray Fluorescence Spectrometry for Chromium Contamination Analysis
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2021 (English)In: Talanta: The International Journal of Pure and Applied Analytical Chemistry, ISSN 0039-9140, E-ISSN 1873-3573, Vol. 230, article id 122236Article in journal (Refereed) Published
Abstract [en]

In most cases, direct X-ray fluorescence (XRF) analysis of solutions entails technical difficulties due to a high X-ray scattering background resulting in a spectrum with a poor signal-to-noise ratio (SNR). Key factors that determine the sensitivity of the method are the energy resolution of the detector and the amount of scattered radiation in the energy range of interest. Limiting the width of the primary spectrum by the use of secondary targets, or filters, can greatly improve the sensitivity for specific portions of the spectrum. This paper demonstrates a potential method for SNR optimization in direct XRF analysis of chromium (Cr) contamination. The suggested method requires minimal sample preparation and achieves higher sensitivity compared to existing direct XRF analysis. Two states of samples, fly ash and leachate from municipal solid waste incineration, were investigated. The effects of filter material, its absorption edge and filter thickness were analyzed using the combination of Monte Carlo N-Particle (MCNP) code and energy-dispersive XRF spectrometry. The applied filter removes primary photons with energies interfering with fluorescence photons from the element of interest, thus results in lower background scattering in the spectrum. The SNR of Cr peak increases with filter thickness and reaches a saturation value when further increased thickness only increases the measurement time. Measurements and simulations show that a Cu filter with a thickness between 100 μm and 140 μm is optimal for detecting Cr by taking into account both the SNR and the exposure time. With direct XRF analysis for solutions, the limit of quantitation (LOQ) of the achieved system was 0.32 mg/L for Cr, which is well below the allowed standard limitation for landfills in Sweden. This work shows that XRF can gain enough sensitivity for direct monitoring to certify that the Cr content in leachate is below environmental limits.

Keywords
Chromium, Environmental monitoring, Hazardous materials, Limit of quantitation (LOQ), Waste management, X-ray fluorescence analysis (XRF)
National Category
Analytical Chemistry Environmental Management
Identifiers
urn:nbn:se:miun:diva-39934 (URN)10.1016/j.talanta.2021.122236 (DOI)000657143300001 ()33934759 (PubMedID)2-s2.0-85103402317 (Scopus ID)
Available from: 2021-03-31 Created: 2020-09-21 Last updated: 2025-02-10Bibliographically approved
Fiederle, M., Procz, S., Hamann, E., Fauler, A. & Fröjdh, C. (2020). Overview of GaAs und CdTe Pixel Detectors Using Medipix Electronics. Crystal research and technology (1981), 55(9), Article ID 2000021.
Open this publication in new window or tab >>Overview of GaAs und CdTe Pixel Detectors Using Medipix Electronics
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2020 (English)In: Crystal research and technology (1981), ISSN 0232-1300, E-ISSN 1521-4079, Vol. 55, no 9, article id 2000021Article in journal (Refereed) Published
Abstract [en]

GaAs and CdTe pixel detectors have been developed over the last few decades. The applications of these detectors include X- and gamma-ray detectors working at room temperature. Fundamental properties such as detection efficiency and noise are determined by the material properties of the sensor material. Different materials have been evaluated over the years in search of the best choice for different types of radiation. This article describes the properties of GaAs and CdTe materials for single photon processing pixel detectors using the Medipix electronics. 

Keywords
CdTe, GaAs, pixel detectors, X-ray radiation
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-39665 (URN)10.1002/crat.202000021 (DOI)000567685600001 ()2-s2.0-85089386687 (Scopus ID)
Available from: 2020-08-25 Created: 2020-08-25 Last updated: 2020-09-25
Rahman, H., An, S., Norlin, B., Fröjdh, C., Persson, E. & Engstrand, P. (2019). Maximized wood chip impregnation efficiency validated by new miniaturized X-ray fluorescence techniques. In: : . Paper presented at 11th Fundamental Mechanical Pulp Research Seminar, Norrköping, Sweden, April 2-4, 2019.
Open this publication in new window or tab >>Maximized wood chip impregnation efficiency validated by new miniaturized X-ray fluorescence techniques
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2019 (English)Conference paper, Oral presentation with published abstract (Refereed)
Abstract [en]

Manufacturing of chemi-thermomechanical pulp (CTMP) is increasing due to increased demand for packaging materials such as cardboard as well as tissue and other hygiene products. Today high yield pulp (HYP) is produced from different wood species. It is well-known that chip-refining is normally responsible for more than 60% of the electric energy consumption in most high yield pulping process. There are opportunities to improve energy efficiency and quality stability in defibration processes by means of optimizing impregnation. Impregnation is a key unit operation in CTMP production as well as in all chemical pulping and biorefinery systems. The efficiency of the impregnation is known to be crucial (Ferritsius et al. 1985; Gorski et al. 2010). Early research showed difficulties to achieve even distribution of sulphite and sodium ions in wood chips resulting in inhomogeneous fibre properties (Bengtsson et al. 1988). Increased and homogenous sulphonation leads to reduced shive content, which is a key factor in all end product applications. To address this issue developing a new type miniaturized X-ray based technique (XRF) to measure local concentration of sulphur and sodium across wood chips and in individual fibres could become a key tool.

 

The presence of elements as sulphur and sodium can be detected by X-ray fluorescence (XRF) or spectral absorption. At the XRF, images the surface of the sample using specific energies from K-shell or L-shell fluorescence. This method is investigated at the X-ray laboratory in Mid Sweden University research centre STC (Sensitive Things that Communicate) (Norlin et al. 2018). At the spectral absorption, images specific K-shell absorption energies in transmission X-ray images of the sample, a method widely used in medical diagnosis. This transmission method might also be further investigated for this application in the future (Frojdh et al. 2013; Reza et al. 2013). Both methods can be validated by using monoenergetic radiation from synchrotron facilities.

 

An XRF imaging system uses a collimated X-ray source and a spectroscopic detector. The sample is scanned to make an image of the content of the substances of interest. A specific challenge in this case is that the low energy fluorescence photons from sulphur (S) and sodium (Na) are easily absorbed in air, which makes imaging in a different atmosphere necessary.

 

The measurement setup has been simulated using MCNP (C. J. Werner, 2017) to validate the system setup and to select the correct, geometry, shielding, filtering and atmosphere for the measurement. The solution was to use a titanium box flooded with helium to minimise the absorption of fluorescence photons and to shield from scattered photons that might disturb the measurement, fig 1. A filter has been added to the X-ray source to make it nearly monoenergetic and to avoid emission of photons with energies close to the expected fluorescence. The system has been used to estimate sodium and sulphur content in low grammage handsheet (CTMP) or single wood chip samples. It is possible to build a laboratory instrument similar to the prototype setup to obtain the distribution of sodium and sulphur in XRF imaging.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Figure 1: Photograph of XRF measurement setup with of moveable Helium atmosphere Ti box

However, the technique we are developing can become useful in mills to improve and control process efficiency, product properties and to find solutions to process problems in future. In addition, a more even distribution of the sulphonation can reduce specific energy demand in chip refining at certain shive content.

 

References

 

1.      Bengtsson, G., Simonson, R., Heitner, C., Beatson, R., and Ferguson, C. (1988): Chemimechanical pulping of birch wood chips, Part 2: Studies on impregnation of wood blocks using scanning electron microscopy and energy dispersive x-ray analysis, Nord. Pulp Paper Res. J. 3 (3), 132-138.

2.      C. J. Werner, (2017): MCNP User's manual, Code Version 6.2, Los Alamos National Laboratory report, LA-UR-17-29981.

3.      Ferritsius, O., and Moldenius, S. (1985): The effect of impregnation method on CTMP properties. In International Mechanical Pulping Conference Proceedings, SPCI, Stockholm (p. 91).

4.      Frojdh, C., Norlin, B. and Frojdh, E. (2013): Spectral X-ray imaging with single photon processing detectors, Journal of Instrumentaion, Volume 8, Article number C02010.  

5.      Gorski, D., Hill, J., Engstrand, P., and Johansson, L. (2010): Reduction of energy consumption in TMP refining through mechanical pre-treatment of wood chips, Nord. Pulp Paper Res. J, 25(2), 156-161.

6.      Norlin, B., Reza, S., Fröjdh, C. and Nordin, T. (2018): Precision scan-imaging for paperboard quality inspection utilizing X-ray fluorescence, Journal of Instrumentation, Volume: 13, Article number C01021.

7.      Reza, S., Norlin, B. and Thim, J. (2013): Non-destructive method to resolve the core and the coating on paperboard by spectroscopic x-ray imaging, Nord. Pulp Paper Res. J. 28 (3), 439-442.

 

Keywords
High Yield Pulp, XRF, CTMP
National Category
Engineering and Technology
Identifiers
urn:nbn:se:miun:diva-36216 (URN)978-91-88527-95-0 (ISBN)
Conference
11th Fundamental Mechanical Pulp Research Seminar, Norrköping, Sweden, April 2-4, 2019
Available from: 2019-05-28 Created: 2019-05-28 Last updated: 2019-05-29Bibliographically approved
Dreier, T., Krapohl, D., Maneuski, D., Lawal, N., Schöwerling, J. O., O'Shea, V. & Fröjdh, C. (2018). A USB 3.0 readout system for Timepix3 detectors with on-board processing capabilities. Paper presented at 20th International Workshop on Radiation Imaging Detectors, Sundsvall, Sweden, JUN 24-28, 2018. Journal of Instrumentation, 13, Article ID C11017.
Open this publication in new window or tab >>A USB 3.0 readout system for Timepix3 detectors with on-board processing capabilities
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2018 (English)In: Journal of Instrumentation, E-ISSN 1748-0221, Vol. 13, article id C11017Article in journal (Refereed) Published
Abstract [en]

Timepix3 is a high-speed hybrid pixel detector consisting of a 256 x 256 pixel matrix with a maximum data rate of up to 5.12 Gbps (80 MHit/s). The ASIC is equipped with eight data channels that are data driven and zero suppressed making it suitable for particle tracking and spectral imaging.

In this paper, we present a USB 3.0-based programmable readout system with online preprocessing capabilities. USB 3.0 is present on all modern computers and can, under real-world conditions, achieve around 320MB/s, which allows up to 40 MHit/s of raw pixel data. With on-line processing, the proposed readout system is capable of achieving higher transfer rate (approaching Timepix4) since only relevant information rather than raw data will be transmitted. The system is based on an Opal Kelly development board with a Spartan 6 FPGA providing a USB 3.0 interface between FPGA and PC via an FX3 chip. It connects to a CERN T imepix 3 chipboard with standard VHDCI connector via a custom designed mezzanine card. The firmware is structured into blocks such as detector interface, USB interface and system control and an interface for data pre-processing. On the PC side, a Qt/C++ multi-platformsoftware library is implemented to control the readout system, providing access to detector functions and handling high-speed USB 3.0 streaming of data from the detector.

We demonstrate equalisation, calibration and data acquisition using a Cadmium Telluride sensor and optimise imaging data using simultaneous ToT (Time-over-Threshold) and ToA (Timeof- Arrival) information. The presented readout system is capable of other on-line processing such as analysis and classification of nuclear particles with current or larger FPGAs.

Keywords
Data processing methods, Detector control systems (detector and experiment monitoring and slow-control systems, architecture, hardware, algorithms, databases), Front-end electronics for detector readout, X-ray detectors
National Category
Subatomic Physics
Identifiers
urn:nbn:se:miun:diva-34944 (URN)10.1088/1748-0221/13/11/C11017 (DOI)000450981800001 ()2-s2.0-85057630487 (Scopus ID)
Conference
20th International Workshop on Radiation Imaging Detectors, Sundsvall, Sweden, JUN 24-28, 2018
Available from: 2018-11-30 Created: 2018-11-30 Last updated: 2025-02-14Bibliographically approved
Thungström, G., Lundgren, A., Menk, R. H., Westerberg, L. & Fröjdh, C. (2018). Investigation of radiation hardness in lateral position sensitive detector, irradiated with 13.5 nm photons. Paper presented at 20th International Workshop on Radiation Imaging Detectors, Sundsvall, SWEDEN, JUN 24-28, 2018. Journal of Instrumentation, 13, Article ID C12015.
Open this publication in new window or tab >>Investigation of radiation hardness in lateral position sensitive detector, irradiated with 13.5 nm photons
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2018 (English)In: Journal of Instrumentation, E-ISSN 1748-0221, Vol. 13, article id C12015Article in journal (Refereed) Published
Abstract [en]

Radiation hardness measurements have been done by irradiating lateral position sensitive (Si) detectors (LPSD) with 93 eV photons. Three different passivation layers have been investigated, SiO2, oxynitride and deposited 4 nm titanium-layer, on p in n-substrate LPSD and deposited 4 nm titanium layer on n in p-substrate LPSD. Best radiation hardness for 93 eV photon is obtained by using a 4 nm titanium layer. Only a slight decrease in response can be seen in the p in n-substrate LPSD. The best radiation hardness is achieved by using the n in p-substrate LPSD, which show no significant decrease in response. Scanning after irradiation with 93 eV gives only a variation in response of 0.26% in the surrounding area of exposure. No decrease in response can be detected during the scan. Test with a 108 eV photon beam gives an increased variation in response of 0.7%, caused by the shallower absorption in Si.

Keywords
Materials for solid-state detectors, Photon detectors for UV, visible and IR photons (vacuum), Radiation-hard detectors
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-35398 (URN)10.1088/1748-0221/13/12/C12015 (DOI)000453207800002 ()2-s2.0-85059896139 (Scopus ID)
Conference
20th International Workshop on Radiation Imaging Detectors, Sundsvall, SWEDEN, JUN 24-28, 2018
Available from: 2019-01-08 Created: 2019-01-08 Last updated: 2024-07-04Bibliographically approved
Norlin, B., Reza, S., Fröjdh, C. & Nordin, T. (2018). Precision scan-imaging for paperboard quality inspection utilizing X-ray fluorescence. Paper presented at 19th International Workshop on Radiation Imaging Detectors (IWORID2017), Krakow, Poland, 2-6 July, 2017. Journal of Instrumentation, 13(1), Article ID C01021.
Open this publication in new window or tab >>Precision scan-imaging for paperboard quality inspection utilizing X-ray fluorescence
2018 (English)In: Journal of Instrumentation, E-ISSN 1748-0221, Vol. 13, no 1, article id C01021Article in journal (Refereed) Published
Abstract [en]

Paperboard is typically made up of a core of cellulose fibers [C6H10O5] and a coating layer of [CaCO3]. The uniformity of these layers is a critical parameter for the printing quality. Current quality control methods include chemistry based visual inspection methods as well as X-ray based methods to measure the coating thickness. In this work we combine the X-ray fluorescence signals from the Ca atoms (3.7 keV) in the coating and from a Cu target (8.0 keV) placed behind the paper to simultaneously measure both the coating and the fibers. Cu was selected as the target material since its fluorescence signal is well separated from the Ca signal while its fluorescence's still are absorbed sufficiently in the paper. A laboratory scale setup is built using stepper motors, a silicon drift detector based spectrometer and a collimated X-ray beam. The spectroscopic image is retrieved by scanning the paperboard surface and registering the fluorescence signals from Ca and Cu. The exposure time for this type of setups can be significantly improved by implementing spectroscopic imaging sensors. The material contents in the layers can then be retrieved from the absolute and relative intensities of these two signals.

Place, publisher, year, edition, pages
IOP Publishing, 2018
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
urn:nbn:se:miun:diva-32724 (URN)10.1088/1748-0221/13/01/C01021 (DOI)000422899200004 ()2-s2.0-85041817589 (Scopus ID)
Conference
19th International Workshop on Radiation Imaging Detectors (IWORID2017), Krakow, Poland, 2-6 July, 2017
Available from: 2018-01-22 Created: 2018-01-22 Last updated: 2024-07-04Bibliographically approved
Norlin, B., Reza, S. & Fröjdh, C. (2017). X-ray fluorescence measurements of toxic metal content in ash from municipal solid waste incineration. In: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD): . Paper presented at 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, France, 29 Oct.-6 Nov. 2016. IEEE, 2017-January, Article ID 8069695.
Open this publication in new window or tab >>X-ray fluorescence measurements of toxic metal content in ash from municipal solid waste incineration
2017 (English)In: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), IEEE, 2017, Vol. 2017-January, article id 8069695Conference paper, Published paper (Refereed)
Abstract [en]

The vision of this paper is development of an online X-ray fluorescence method for monitoring of metal content in ash from municipal solid waste (MSW) incineration. With such measurements directly on site it is possible to optimize an ash washing process in incineration plants, allowing the fly ash to be stored in a landfill for non-hazardous waste. The presented X-ray fluorescence measurement assures that the measurement accuracy is sufficient for metal content monitoring. The actual measurement process is also fast enough to be possible to implement as an online measurement method. The optimal measurement setup is different for different metals. Several different metals might need environmental monitoring, which metals might vary over time due to systematic variations in waist content. Detection of a wide range of metals will require an X-ray source with variable voltage and multiple detectors.

Place, publisher, year, edition, pages
IEEE, 2017
National Category
Engineering and Technology
Identifiers
urn:nbn:se:miun:diva-31947 (URN)10.1109/NSSMIC.2016.8069695 (DOI)000432419500317 ()2-s2.0-85041723656 (Scopus ID)
Conference
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, France, 29 Oct.-6 Nov. 2016
Available from: 2017-10-24 Created: 2017-10-24 Last updated: 2020-09-25Bibliographically approved
Fröjdh, C., Krapohl, D. & Thungström, G. (2016). Hard X-ray imaging and particle detection with TIMEPIX3. In: Proceedings of SPIE - The International Society for Optical Engineering: . Paper presented at SPIE Conference on Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, AUG 29-31, 2016, San Diego, CA. SPIE - International Society for Optical Engineering, 9968, Article ID UNSP 99680T.
Open this publication in new window or tab >>Hard X-ray imaging and particle detection with TIMEPIX3
2016 (English)In: Proceedings of SPIE - The International Society for Optical Engineering, SPIE - International Society for Optical Engineering, 2016, Vol. 9968, article id UNSP 99680TConference paper, Published paper (Refereed)
Abstract [en]

CMOS pixel electronics open up for applications with single photon or particle processing. TIMEPIX3 is a readout chip in the MEDIPIX family with the ability to simultaneously determine energy and time of interaction in the pixel. The device is fully event driven, sending out data on each interaction at a maximum speed of about 40 Mhits/s. The concept allows for off-line processing to correct for charge sharing or to find the interaction point in multi pixel events. The timing resolution of 1.56 ns allows for three dimensional tracking of charged particles in a thick sensor due to the drift time for the charge in the sensor. The experiments in this presentation have been performed with silicon sensors bonded MEDIPIX family chips with special focus on TIMEPIX3. This presentation covers basic performance of the chip, spectral imaging with hard X-rays, detection and imaging with charged particles and neutrons. Cluster identification, centroiding and charge summing is extensively used to determine energy and position of the interaction. For neutron applications a converter layer was placed on top of the sensor.

Place, publisher, year, edition, pages
SPIE - International Society for Optical Engineering, 2016
Series
Proceedings of SPIE, ISSN 0277-786X ; 9968
Keywords
charge sharing, particle identification, Pixel detector, single photon processing
National Category
Physical Sciences
Identifiers
urn:nbn:se:miun:diva-29806 (URN)10.1117/12.2238505 (DOI)000389506700013 ()2-s2.0-85007206718 (Scopus ID)STC (Local ID)978-1-5106-0327-1 (ISBN)978-1-5106-0328-8 (ISBN)STC (Archive number)STC (OAI)
Conference
SPIE Conference on Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, AUG 29-31, 2016, San Diego, CA
Available from: 2017-01-02 Created: 2017-01-02 Last updated: 2017-06-30Bibliographically approved
Organisations
Identifiers
ORCID iD: ORCID iD iconorcid.org/0000-0002-8325-5177

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